<rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom" xmlns:media="http://search.yahoo.com/mrss/"><channel><title>Zibb.com: Verigy Limited (Events)</title><link>http://www.zibb.com/all/theme/cq/Verigy+Limited</link><atom:link rel="self" type="application/rss+xml" href="http://www.zibb.com/all/theme/cq/Verigy+Limited" /><description>
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				</language><webMaster>search@zibb.com (RB Search)</webMaster><copyright>Copyright (c) 2007 Reed Business Information. All rights reserved.</copyright><pubDate>Mon, 23 Nov 2009 23:35:53 GMT</pubDate><lastBuildDate>Mon, 23 Nov 2009 23:35:53 GMT</lastBuildDate><ttl>60</ttl><image><title>Zibb.com: Verigy Limited (Events)
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					</url></image><item><title>Papers Invited for VOICE 2007, Verigy's 2nd Annual Conference for...
      </title><link>https://www.verigy.com/portal/page/portal/Internet%20Highlights/Highlights%20(Final)/Press%20Release%20Repository/Papers%20Invited%20for%20VOICE%202007%20Verigy's%202nd%20Annual%20Conference</link><description>CUPERTINO, Calif. - March 12, 2007 - Verigy (NASDAQ: VRGY), a premier semiconductor test company, has issued the call-for-papers for VOICE 2007, the second annual conference for Verigy customers and partners using the V93000 SOC Series and the V5000 Series of memory testers.</description><guid>https://www.verigy.com/portal/page/portal/Internet%20Highlights/Highlights%20(Final)/Press%20Release%20Repository/Papers%20Invited%20for%20VOICE%202007%20Verigy's%202nd%20Annual%20Conference</guid><category domain="http://www.zibb.com">Verigy Limited</category><pubDate /><source url="http://www.verigy.com" /></item><item><title>Papers Invited for VOICE 2008</title><link>https://www.verigy.com/portal/page/portal/Internet%20Highlights/Highlights%20(Final)/Press%20Release%20Repository/Papers%20Invited%20for%20VOICE%202008%20Verigy's%203rd%20Annual%20Conference</link><description>CUPERTINO, Calif. - March 10, 2008- Verigy (NASDAQ: VRGY), a premier semiconductor test company, has issued the call-for-papers for VOICE 2008, the third annual conference for Verigy customers and partners using the V93000 SOC Series and the V5000 Series of memory testers.</description><guid>https://www.verigy.com/portal/page/portal/Internet%20Highlights/Highlights%20(Final)/Press%20Release%20Repository/Papers%20Invited%20for%20VOICE%202008%20Verigy's%203rd%20Annual%20Conference</guid><category domain="http://www.zibb.com">Verigy Limited</category><pubDate /><source url="http://www.verigy.com" /></item><item><title>Events</title><link>https://www.verigy.com/portal/page/portal/13CA43AED84C59AEE040100A863A7801</link><description>International Microwave Symposium 2008 Verigy has been invited to deliver a presentation discussing ATE Signal Integrity challenges in the “Applications and Misapplications of Measurement Uncertainty” Workshop at the International Microwave Symposium 2008.</description><guid>https://www.verigy.com/portal/page/portal/13CA43AED84C59AEE040100A863A7801</guid><category domain="http://www.zibb.com">Verigy Limited</category><pubDate /><source url="http://www.verigy.com" /></item><item><title>Productivity Tools and Enhancements</title><link>https://www.verigy.com/portal/page/portal/Internet%20Homepage/Events/VOICE%202007/Technical%20Program/Productivity%20Tools%20and%20Enhancements%20-%20Day%20Two</link><description>The new tool enables handling of conventional tester oriented vectors as device oriented vectors without paying attention to tester cycle boundaries. Using a table-based GUI, vectors comprising different X-modes can be browsed and edited on a time series together with execution errors.</description><guid>https://www.verigy.com/portal/page/portal/Internet%20Homepage/Events/VOICE%202007/Technical%20Program/Productivity%20Tools%20and%20Enhancements%20-%20Day%20Two</guid><category domain="http://www.zibb.com">Verigy Limited</category><pubDate /><source url="http://www.verigy.com" /></item></channel></rss>