Teradyne Signs Development Partnership with Teseda to Provide Scan Diagnosis Tool

Teradyne announced the signing of an exclusive development agreement with Teseda Corp. to produce Scan Workbench, a portable scan debug and yield enhancement tool.

Based on data protocols and the existing Teseda Workbench (TWB) and Diagnostic Manager (DM) products, the companies said that Scan Workbench will allow test engineers to perform rapid silicon debug, design validation, failure analysis and yield monitoring resulting in decreased time-to-market and improved profitability.

Scan Workbench provides a consistent debug and optimization environment based on IEEE 1450.0-1999 Standard Test Interface Language (STIL) and the new STDF V4-2007 datalog standards. The software will initially be deployed on the Teradyne FLEX and J750 platforms which will provide Scan Workbench with access to an installed base of over 5,000 testers. The new toolset will be shipping in the second half of 2010.

"Teradyne is committed to making productivity tools available to our customers by creating standards-based interfaces to the IG-XL software environment," noted Rod Stewart, general manager, Teradyne SOC Business unit. "This expanded collaboration with Teseda provides capability that will allow Teradyne customers to improve time-to-market and device yields for devices that use increasingly smaller silicon geometries."

Teradyne is a supplier of Automatic Test Equipment used to test complex electronics used in the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries.

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