Visit TI at ESC San Jose

News  |  esc-sv09.techinsightsevents.com | Mar 1, 2009

ESC is where global design engineers meet for essential technical training classes and accreditation.

http://esc-sv09.techinsightsevents.com/

MSESystems and Mse Optical Systems

MSE specializes in systems integration of laser diode, electro-optic, and instrumentation system design. We specialize in OEM product development and testing. We consult and manufacture in these markets. We use LabVIEW, AutoCAD, and other computer tools for the design process.

http://www.msesystems.com/

EDN: Information, News, & Business Strategy for Electronics Design Engineers

Web  |  www.edn.com

EDN.com is a comprehensive information source for providing in-depth technical information for electronics design engineers and news and business strategy insight for executives

http://wwebb@www.edn.com/

Electric Actuators Improve Productivity of Modular Bagging System

News  |  www.designnews.com | Nov 18, 2009

Thiele Technologies, a leader in packaging technology and equipment, faced a problem of how to compensate for inconsistent bag dimensions on its popular modular bag filling and sealing system.

http://www.designnews.com/article/388493-Electric_Actuators_Improve_Productivity_of_Modular_Bagging_System.php?rssid=20056

Electronics Design and Manufacturing

Digital Systems Design Pty Ltd ELECTRONICS DESIGN and MANUFACTURE Project History GPS / RFID RFID and/or DGPS Tracking systems : Interface and/or complete solutions X MESSAGING Factory / warehouse display systems, Data Liners, Mimic panels SOLAR IRRIGATION SYSTEMS 4-16 channel, programmable

http://www.digsys.com.au/

Xilinx offers new XtremeDSP development kit

News  |  www.electronicsweekly.com | Jan 29, 2008

Xilinx, the world's leading provider of programmable solutions, today announced immediate availability of the new XtremeDSP™ tools package along with the availa

http://www.electronicsweekly.com/Products/Product.aspx?liProductID=2363

Test system upgrades can expose problems

News  |  www.tmworld.com | Sep 1, 2009

When you upgrade a legacy test system, be prepared to uncover new problems or to revisit problems for which you found a workaround in the past.

http://www.tmworld.com/article/328877-Test_system_upgrades_can_expose_problems.php?rssid=20422

Untitled Document

Office 212 Rush Building Address College of Information Science and Technology Drexel University 3141 Chesnut St. Philadelphia, PA 19104 Telephone (215) 895-1903 Email At Drexel Business

http://www.tjinc.com/

USB 3.0: A SIMPLE IDEA FULL OF CHALLENGES

News  |  www.edn-europe.com

Super-speed USB (Universal Serial Bus) 3.0 sounds like a great idea. Just start with widely used, fast, and bulletproof USB 2.0 and transplant the PHY (physical-layer) interface from another common and reliable standard, PCIe (peripheral-component-interconnect express) Generation 2. Put two

http://www.edn-europe.com/usb30asimpleideafullofchallenges+article+3190+Europe.html

CEDIA Publishes Technical Manual

News  |  www.twice.com | Jul 17, 2009

Indianapolis - CEDIA published the first edition of its Electronic Systems Technical Reference Manual.

http://www.twice.com/article/315656-CEDIA_Publishes_Technical_Manual.php?rssid=20320