<rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom" xmlns:media="http://search.yahoo.com/mrss/"><channel><title>Zibb.com: Electronics/Test &amp; Measurement/ATE (All Sources)</title><link>http://www.zibb.com/electronics/interstitial/all/Electronics_Test+%26+Measurement_ATE</link><atom:link rel="self" type="application/rss+xml" href="http://www.zibb.com/electronics/interstitial/all/Electronics_Test+%26+Measurement_ATE" /><description>
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				</language><webMaster>search@zibb.com (RB Search)</webMaster><copyright>Copyright (c) 2007 Reed Business Information. All rights reserved.</copyright><pubDate>Mon, 01 Jun 2009 00:00:00 GMT</pubDate><lastBuildDate>Mon, 01 Jun 2009 00:00:00 GMT</lastBuildDate><ttl>60</ttl><image><title>Zibb.com: Electronics/Test &amp; Measurement/ATE (All Sources)
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					</url></image><item><title>VTI's VXI modules enable customization of ATE systems</title><link>http://www.tmworld.com/article/319065-VTI_s_VXI_modules_enable_customization_of_ATE_systems.php?rssid=20431</link><description>Three modules join the SMIP series of signal switch modules from VTI Instruments, offering engineers more choices for creating their ATE systems.</description><guid>http://www.tmworld.com/article/319065-VTI_s_VXI_modules_enable_customization_of_ATE_systems.php?rssid=20431</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Mon, 01 Jun 2009 00:00:00 GMT</pubDate><source url="http://www.tmworld.com" /></item><item><title>H+W Home Page</title><link>http://www.hwtestproducts.com/</link><description>H+W Test Products, Inc. , is the largest independently owned test fixture kit manufacturer in the world. Test fixture kits for most major Automated Test Equipment (ATE) testers are available from stock, ready for same day shipments worldwide.</description><guid>http://www.hwtestproducts.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.hwtestproducts.com" /></item><item><title>ADCs shrink in size, power for portable-scanner sockets</title><link>http://www.edn.com/article/CA6541390.html</link><description>Texas Instruments’ analog-products group has introduced the ADS5281, ADS5282, and ADS5287 series of ADCs featuring 10- and 12-bit resolution and sampling speeds as high as 65M samples/sec. The units come in octal format—that is, eight per package—for compactness and low power consumption.</description><guid>http://www.edn.com/article/CA6541390.html</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Thu, 20 Mar 2008 00:00:00 GMT</pubDate><source url="http://www.edn.com" /></item><item><title>Demand Spikes for Multi-Site Testing</title><link>http://www.semiconductor.net/article/196643-Demand_Spikes_for_Multi_Site_Testing.php?rssid=20224</link><description>Multi-site testing of SoC devices is now emerging as a major trend to drive down the cost of test. Test vendors also are developing adaptive testing: leveraging the previous test results from a device as it goes through various test steps.</description><guid>http://www.semiconductor.net/article/196643-Demand_Spikes_for_Multi_Site_Testing.php?rssid=20224</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Thu, 22 Jan 2009 14:03:00 GMT</pubDate><source url="http://www.semiconductor.net" /></item><item><title>Intepro - Power Electronics Test System Specialists</title><link>http://www.inteproate.com/</link><description>This extremely versatile software can be used for functional PSU testing and burn-in test. PowerStar 5 is a very comprehensive software package with ease of use featuring highly.</description><guid>http://www.inteproate.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.inteproate.com" /></item><item><title>Intersil's Pin Driver Doubles Throughput for Automated Test Equip...
      </title><link>http://www.ednasia.com/article-5866-intersilspindriverdoublesthroughputforautomatedtestequipment-Asia.html-Asia.html</link><description>Intersil Corporation, in the design and manufacture of analog solutions, announced a quad 18V pin electronics driver and quad window comparator. The ISL55100A integrates four independent, programmable</description><guid>http://www.ednasia.com/article-5866-intersilspindriverdoublesthroughputforautomatedtestequipment-Asia.html-Asia.html</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Wed, 15 Mar 2006 16:00:00 GMT</pubDate><source url="http://www.ednasia.com" /></item><item><title>QA Technology, Inc.</title><link>http://www.qatech.com/</link><description>QA Technology has been serving the electronics testing industry for over twenty-five years, designing industry leading test probes for in-circuit testing of printed circuit boards and for interfacing test fixtures to automatic test equipment (ATE).</description><guid>http://www.qatech.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.qatech.com" /></item><item><title>Comment: Will LTX-Credence survive ATE arena?</title><link>http://www.eetasia.com/ART_8800577817_480300_NT_2d749e2a.HTM</link><description>Mark LaPedus opines on the LTX-Credence's chances of competing against ATE big shots such as Advantest, Verigy and Teradyne.</description><guid>http://www.eetasia.com/ART_8800577817_480300_NT_2d749e2a.HTM</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Tue, 07 Jul 2009 00:00:00 GMT</pubDate><source url="http://www.eetasia.com" /></item><item><title>AIS</title><link>http://www.ais4ndt.com/</link><description>Automated Inspection Systems (AIS) is a technology-oriented company specializing in Automated Ultrasonic Testing (AUT) equipment, applications development, and field service / support.</description><guid>http://www.ais4ndt.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.ais4ndt.com" /></item><item><title>NI Teams with Freescale, Wind River and Analog Devices</title><link>http://www.designnews.com/blog/Electronics_News_and_Comment/570-NI_Teams_with_Freescale_Wind_River_and_Analog_Devices.php</link><description>The latest news and information on analog/digital control, components/hardware, embedded systems, power/thermal management, and sensors for design engineers.</description><guid>http://www.designnews.com/blog/Electronics_News_and_Comment/570-NI_Teams_with_Freescale_Wind_River_and_Analog_Devices.php</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Wed, 04 Apr 2007 22:03:43 GMT</pubDate><source url="http://www.designnews.com" /></item><item><title>Essemtec Increases Production Capacity | EMAsiaMag.com</title><link>http://www.emasiamag.com/article-4059-essemtecincreasesproductioncapacity-Asia.html</link><description>Essemtec announced that it has increased its production capacity on July 3 and 4, 2008, adding more than 1220 sqm of production and office space to its headquarters production space in Aesch, Switzerl</description><guid>http://www.emasiamag.com/article-4059-essemtecincreasesproductioncapacity-Asia.html</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Tue, 15 Jul 2008 07:39:03 GMT</pubDate><source url="http://www.emasiamag.com" /></item><item><title>FETtest - Tester Solutions for Transistor , FET , Diode and other...
      </title><link>http://www.fettest.com/</link><description>The AMX400 supports wafer sort through final test applications. Our discrete test capabilities go well beyond testing field effect transistors, and in fact, most are used to test bipolar devices.</description><guid>http://www.fettest.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.fettest.com" /></item><item><title>Integrated Circuit (IC) Digital Automatic Test Equipment (ATE) in...
      </title><link>http://www.zibbsearch.nl/elektronica/suppliers/integrated+circuit+(ic)+digital+automatic+test+equipment+(ate)/nl/25881702</link><description>Integrated Circuit (IC) Digital Automatic Test Equipment (ATE) in Netherlands</description><guid>http://www.zibbsearch.nl/elektronica/suppliers/integrated+circuit+(ic)+digital+automatic+test+equipment+(ate)/nl/25881702</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Sun, 07 Oct 2007 00:00:00 GMT</pubDate><source url="http://www.zibbsearch.nl" /></item><item><title>Overview of the RF MEMS Switch Market Globally - Bharatbook</title><link>http://www.prlog.org/10207048-overview-of-the-rf-mems-switch-market-globally-bharatbook.html</link><description>Overview of the RF MEMS Switch Market Globally - Bharatbook. bharatbook.com included a new report "MEMS Switch and Varicap Market" provide a global view of the RF MEMS switch market.</description><guid>http://www.prlog.org/10207048-overview-of-the-rf-mems-switch-market-globally-bharatbook.html</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Sat, 28 Mar 2009 13:11:02 GMT</pubDate><source url="http://www.prlog.org" /></item><item><title>Automatic Test Equipment - ATE Systems and Equipment - Wayne Kerr...
      </title><link>http://www.terotest.com/</link><description>Established in 1982, Terotest continues to focus on the supply and support of Automatic Test Equipment (ATE). Our in-depth knowledge of testing and attention to detail enable us to provide flexible and cost-effective solutions to meet the everchanging needs of test departments the world over.</description><guid>http://www.terotest.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.terotest.com" /></item><item><title>Aeroflex enhances the capability of its 5800 Series multi configu...
      </title><link>http://www.electronicspecifier.com/ATE-Systems/Aeroflex-enhances-the-capability-of-its-5800-Series-multi-configuration-multi-function-ATE-system.asp</link><description>Aeroflex enhances the capability of its 5800 Series multi-configuration, multi-function ATE system : Electronics News from Electronic Specifier</description><guid>http://www.electronicspecifier.com/ATE-Systems/Aeroflex-enhances-the-capability-of-its-5800-Series-multi-configuration-multi-function-ATE-system.asp</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Tue, 21 Nov 2006 00:00:00 GMT</pubDate><source url="http://www.electronicspecifier.com" /></item><item><title>TechGenesis Inc. - Corporate Web site</title><link>http://www.techgenesis1.com/</link><description>TechGenesis Inc. specializes in Cypress PSoC (Programmable System On Chip) development. We develop powerful solutions using the PSoC mixed signal IC for applications from EOL replacement parts to complete PSoC based systems.</description><guid>http://www.techgenesis1.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.techgenesis1.com" /></item><item><title>EEbeat › Buddy, can you spare some pins?</title><link>http://www.eebeat.com/?p=1031</link><description>The Far Side comics, but I have this picture in my head of a poor down-trodden test engineer on a street corner with a scribbled cardboard sign that reads, “Can you spare some pins?</description><guid>http://www.eebeat.com/?p=1031</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Mon, 29 Jun 2009 00:00:00 GMT</pubDate><source url="http://www.eebeat.com" /></item><item><title>Test Technologists Team</title><link>http://www.ttt.com/</link><description>1880 Esberg Rd, Los Altos CA 94024 (t) 650.948.8647 (f) 650.941.0144 email: inquiries@ttt.</description><guid>http://www.ttt.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.ttt.com" /></item><item><title>Linear Technology s 16-Bit Octal SPI DAC Achieves ±4LSB INL | WDD...
      </title><link>http://www.wirelessdesignasia.com/article-11039-lineartechnologys16bitoctalspidacachieves4lsbinl-Asia.html</link><description>Linear Technology Corp. introduces the LTC2656, a 16-bit octal digital-to-analog converter (DAC) that offers ±4LSB INL maximum over temperature, a factor of three times better than the nearest octal competitor. The combination of low 0.1 percent (max) gain error and low ±2mV (max) offset error</description><guid>http://www.wirelessdesignasia.com/article-11039-lineartechnologys16bitoctalspidacachieves4lsbinl-Asia.html</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.wirelessdesignasia.com" /></item><item><title>MEMS Switch and Varicap Market Report</title><link>http://www.azonano.com/news.asp?newsID=13954</link><description>Research and Markets, the leading source for international market research and market data, has announced the addition of "MEMS Switch and Varicap Market Report" to their offering.</description><guid>http://www.azonano.com/news.asp?newsID=13954</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.azonano.com" /></item><item><title>Sun Diagnostics</title><link>http://www.sun-diagnostics.com/</link><description>Handheld-Diagnosetools, Handheld-Diagnosetools GOOD (ETHOS™), Handheld-Diagnosetools BETTER (SOLUS™), Handheld-Diagnosetools SOLUS PRO™, Handheld-Diagnosetools BEST (MODIS™), Handheld-Diagnosetools SOLUS™ Upgrade Kits, Handheld-Diagnosetools MODIS™ Upgrade Kits, Handheld-Diagnosetools Adaptor / Key</description><guid>http://www.sun-diagnostics.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.sun-diagnostics.com" /></item><item><title>Magnetic-field measurements hold the key to reducing dc/dc EMI</title><link>http://www.edn-europe.com/magneticfieldmeasurementsholdthekeytoreducingdcdcemi+article+148+Europe.html</link><description>Performance-driven measurement instrumentation requires low-noise, high-bandwidth linear front-end circuits that combine with equally well-performing A/D converters and clocking (Figure 1). Designers work to quantize the measurement of interest into a digital signal early in the processing chain to</description><guid>http://www.edn-europe.com/magneticfieldmeasurementsholdthekeytoreducingdcdcemi+article+148+Europe.html</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.edn-europe.com" /></item><item><title>Lloyd Doyle with new AOI range</title><link>http://www.evertiq.com/news/15450</link><description>The automatic optical test and inspection equipment manufacturer, Lloyd Doyle from the UK, has pushed a new range of Automatic Optical Test equipment on to the market, which will be released first to the Asian manufacturing market. - Created: 2009-11-06 12:30, By: Anke Schröter, Source: evertiq,</description><guid>http://www.evertiq.com/news/15450</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate>Fri, 06 Nov 2009 11:30:00 GMT</pubDate><source url="http://www.evertiq.com" /></item><item><title>Power Supply Test, Power Test, Automated Test Equipment, ATE, UPS...
      </title><link>http://www.autotest.com/</link><description>Autotest has provided Standard and Custom Automated Test Systems for Power Supplies and UPS products for over 25 years. Please use this website to take a closer look as some of our people products and services.</description><guid>http://www.autotest.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/ATE</category><pubDate /><source url="http://www.autotest.com" /></item></channel></rss>