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EDN Access--06.05.97 Provide ESD protection for I/O ports
del.icio.us My Yahoo Digg this newsvine Blogger StumbleUpon Reddit Facebook RSS Magazine eNewsletters Reprints/License Print Email EDN Access--06.05.97 Provide ESD protection for I/O ports -- EDN, June 5, 1997 June 5, 1997 Provide ESD protection for I/O ports Brett Fox and Pirooz Parvarandeh, Maxim
Revised waveform drives ESD standards
IEC 61000-4-2, the Basic Standard for electrostatic discharge (ESD) immunity (Ref. 1), is being revised to change how the standard defines ESD test waveforms. Proposals to the standard aim to define a more realistic and more repeatable discharge-current waveform for ESD simulators. The improved
Transient Voltage Suppressor protects multimedia interfaces., STMicroelectronics
STMicroelectronics Sets the Standard for Protecting High-Speed Multimedia Interfaces, STMicroelectronics
Union_UM3483E,UM3486E.p65
Union Semiconductor, Inc. httpwww.union-ic.com UM3483E, UM3486E 3.3V-Powered, ±15kV ESD-Protected, and Slew-Rate-Limited True RS-485 Transceivers General Description The UM3483E, UM3486E are +15 KV ESD protected, slew-rate limited, ultra lower differential line transceivers which provide full
CM1206 -- ESD Protection Arrays, Chip Scale Package
© 2004 California Micro Devices Corp. All rights reserved. 06/28/04 430 N. McCarthy Blvd., Milpitas, CA 95035-5112 ● Tel: 408.263.3214 ● Fax: 408.263.7846 ● www.calmicro.com 1 CM1206 ESD Protection Arrays, Chip Scale Package Features • Functionally and pin compatible with CMD’s
ST | STMicroelectronics Proves Performance Advantage with World’s Only Silicon Protection Diodes
STMicroelectronics is a global leader in developing and delivering System-on-Chip (SoC) and semiconductor solutions across the spectrum of microelectronics applications: communications, computer peripherals, digital consumer, automotive, smartcards.
Understand the differences in ESD tests
Whenever an electrically charged object discharges, it produces an ESD (electrostatic discharge) event. An ESD event can subject an electronic device to thousands of volts and several amperes. High voltage can cause breakdown in a device structure and high current can cause heat that damages the
Standards efforts target ESD simulator repeatability
Standards efforts target ESD simulator repeatability Staff -- Test & Measurement World, 1/2/2002 4:15:00 PM From the ESD advertising supplement to Test & Measurement World, August 2001. Standards efforts target ESD simulator repeatability The time has come for a defined test method that will let
Protection at full power
Protecting circuits may not be at the forefront of every design engineer's mind, but it is paramount in the minds of Littelfuse engineers, who subject components to excessive current, lightning, ESD, overvoltage, and extreme temperatures.
ESD tests generate different results
Whenever an electrically charged object discharges, it produces an ESD (electrostatic discharge) event. An ESD event can subject an electronic device to thousands of volts and several amperes. High voltage can cause a breakdown in a device structure, and high current can generate heat that damages
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