<rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom" xmlns:media="http://search.yahoo.com/mrss/"><channel><title>Zibb.com: Electronics/Test &amp; Measurement/Failure Analysis (All Sources)</title><link>http://www.zibb.com/electronics/interstitial/all/Electronics_Test+%26+Measurement_Failure+Analysis</link><atom:link rel="self" type="application/rss+xml" href="http://www.zibb.com/electronics/interstitial/all/Electronics_Test+%26+Measurement_Failure+Analysis" /><description>
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				</language><webMaster>search@zibb.com (RB Search)</webMaster><copyright>Copyright (c) 2007 Reed Business Information. All rights reserved.</copyright><pubDate>Mon, 02 Nov 2009 00:00:00 GMT</pubDate><lastBuildDate>Mon, 02 Nov 2009 00:00:00 GMT</lastBuildDate><ttl>60</ttl><image><title>Zibb.com: Electronics/Test &amp; Measurement/Failure Analysis (All Sources)
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					</url></image><item><title>Mentor assembles a test-yield fusion platform</title><link>http://www.edn.com/article/CA6704702.html?nid=3673</link><description>A pair of new yield-analysis tools kicks off a new fused test and yield product line.</description><guid>http://www.edn.com/article/CA6704702.html?nid=3673</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Mon, 02 Nov 2009 00:00:00 GMT</pubDate><source url="http://www.edn.com" /></item><item><title>Small Services, Inc.</title><link>http://www.smallservices.net/</link><description>SMALL SERVICES is an independent power supply design and consulting practice specializing in power electronics, power supplies, and related technologies. Ken Small is the principal consultant and project manager.</description><guid>http://www.smallservices.net/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.smallservices.net" /></item><item><title>RCA Readies First Wireless MP3 Player</title><link>http://www.twice.com/article/247674-RCA_Readies_First_Wireless_MP3_Player.php</link><description>The market's first MP3 player with integrated wireless-headphone technology will be available in October from RCA, and wireless accessories due in coming months from other brands will use the same wireless technology. The 2.4GHz technology, developed by Cupertino-based semiconductor developer</description><guid>http://www.twice.com/article/247674-RCA_Readies_First_Wireless_MP3_Player.php</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Mon, 08 Oct 2007 00:00:00 GMT</pubDate><source url="http://www.twice.com" /></item><item><title>Thermal imaging finds faults quickly</title><link>http://www.tmworld.com/article/325713-Thermal_imaging_finds_faults_quickly.php?rssid=20423</link><description>As chip sizes continue to get smaller, the ability to detect uneven heat generation and thermal dissipation on a chip’s surface becomes increasingly difficult but also increasingly important.</description><guid>http://www.tmworld.com/article/325713-Thermal_imaging_finds_faults_quickly.php?rssid=20423</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Wed, 01 Apr 2009 00:00:00 GMT</pubDate><source url="http://www.tmworld.com" /></item><item><title>USB Video Adapter for Windows XP and Vista &amp; USB 2.0 Video adapte...
      </title><link>http://www.usbvideoadapter.com/</link><description>EasyCap USB2.0 Video Adapter with Audio ------ From DV/Camcorders/TV/Spycam/VHS BACK IN STOCK, FULL WINDOWS VISTA SUPPORT! The EasyCAP USB 2.0 Video Adapter with Audio, it can capture High-quality video and audio file direct by USB 2.0 interface without sound card.</description><guid>http://www.usbvideoadapter.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.usbvideoadapter.com" /></item><item><title>Solenoid valve rated for ten million cycles</title><link>http://www.designnews.com/article/8372-Solenoid_valve_rated_for_ten_million_cycles.php</link><description>Fairfield, N.J. — As human genome research shifts into high gear, engineers are increasingly searching for components with exceptionally high cycle-life to meet the "stop and drop" motion requirements of genomic equipment. Now, a new two-way solenoid valve reportedly meets those needs.</description><guid>http://www.designnews.com/article/8372-Solenoid_valve_rated_for_ten_million_cycles.php</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Mon, 16 Dec 2002 00:00:00 GMT</pubDate><source url="http://www.designnews.com" /></item><item><title>Audio Showcase: Your online source for audio / video cables and a...
      </title><link>http://www.audioshowcase.com/</link><description>Welcome to Audio Showcase, a division of CableWholesale.com. Continuing the tradition of CableWholesale.com, our goal is to offer the widest variety of audio / video products and accessories at the lowest prices on the 'Net. Just browse our online catalog!</description><guid>http://www.audioshowcase.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.audioshowcase.com" /></item><item><title>Failure Analysis Software</title><link>http://www.semiconductor.net/article/207551-Failure_Analysis_Software.php</link><description>ESCOSY Plus-CAD Navigation is a PC-based navigation software for failure analysis. It runs on analytical tools like SEMs, AFMs, FIBs, PEMs, SIMS, dual-beam systems or optical microscopes, and navigate to fail positions on wafers and in single dies. Feat</description><guid>http://www.semiconductor.net/article/207551-Failure_Analysis_Software.php</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Mon, 02 Apr 2001 06:00:00 GMT</pubDate><source url="http://www.semiconductor.net" /></item><item><title>News | CBG Corp.</title><link>http://www.cbgcorp.com/news/2009/08/24/chinese-customers-visit-cbg/</link><description>CBG Corporation is an engineering and manufacturing company focused on the changing needs of the Petroleum Exploration and Production industries. Since 1992, CBG has been supplying the industry with state-of-the-art logging tools and sensors for Production Logging, Open-Hole Logging, Directional</description><guid>http://www.cbgcorp.com/news/2009/08/24/chinese-customers-visit-cbg/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Thu, 24 Sep 2009 00:00:00 GMT</pubDate><source url="http://www.cbgcorp.com" /></item><item><title>Optocap - Opto and micro electronics packaging supplier</title><link>http://www.optocap.com/</link><description>Optocap Ltd is a Design, Engineering and Manufacturing Service provider for packaging and assembly in the Microelectronics and Optoelectronics industry. Optocap provides advanced packaging solutions to a world-wide client base of blue chip multinationals and leading edge start-ups.</description><guid>http://www.optocap.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.optocap.com" /></item><item><title>Download paper on best practices for built-in test</title><link>http://www.home.agilent.com/upload/cmc_upload/All/Best-Practices-for-BIT-Coverage-and-Diagnostics.pdf</link><description>Abstract – Idealy, everyone would like to embed test into their products today, whether it’s to reduce costs, build in support capabilities, ensure better quality, reduce dependacy on expert technicians, or for one of many other intelligent motivations.</description><guid>http://www.home.agilent.com/upload/cmc_upload/All/Best-Practices-for-BIT-Coverage-and-Diagnostics.pdf</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.home.agilent.com" /></item><item><title>SEM, TEM and EDS Courses</title><link>http://www.emcourses.com/</link><description>We are a small company who have been running courses using scanning (SEM) and transmission electron microscopes (TEM) and their associated x-ray analytical systems (EDS) since 1982.</description><guid>http://www.emcourses.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.emcourses.com" /></item><item><title>Optical Microscopes in Netherlands</title><link>http://www.zibbsearch.nl/elektronica/suppliers/optical+microscopes/nl/25751575</link><description>Optical Microscopes - Netherlands ǂ Advertentie</description><guid>http://www.zibbsearch.nl/elektronica/suppliers/optical+microscopes/nl/25751575</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Sun, 07 Oct 2007 00:00:00 GMT</pubDate><source url="http://www.zibbsearch.nl" /></item><item><title>Study: Test shortcuts cause memory failures</title><link>http://www.eetasia.com/ART_8800588162_499486_NT_a658b1cb.HTM</link><description>The electronics industry's short cuts and limiting in-house memory procedures have caused an inordinate amount of failures for DRAMs, NAND and related devices in the consumer market.</description><guid>http://www.eetasia.com/ART_8800588162_499486_NT_a658b1cb.HTM</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Fri, 30 Oct 2009 00:00:00 GMT</pubDate><source url="http://www.eetasia.com" /></item><item><title>Rose Batteries.com: batteries, custom battery packs, chargers and...
      </title><link>http://www.rosebatteries.com/</link><description>Check out Selecting the Right Battery or our free Technical Library. If you're an engineer phone our Engineering Hotline, Order a Sample or Get a Quote.</description><guid>http://www.rosebatteries.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.rosebatteries.com" /></item><item><title>SOLINO</title><link>http://it.zibb.com/trademark/solino/29867515</link><description>Solino® is a registered trademark used for Caliper Stages Dial Indicators and owned by Riedi, Markus. Full trade mark registration details, registered images and more information below.</description><guid>http://it.zibb.com/trademark/solino/29867515</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://it.zibb.com" /></item><item><title>Scanning electron microscope for gunshot residue analysis</title><link>http://spie.org/x37009.xml</link><description>FEI Company recently announced the release of two dedicated scanning electron microscopes (SEMs) and a new software package for automated analysis of gunshot residues (GSR). Forensic scientists use GSR analysis to match residues from victims and suspects.</description><guid>http://spie.org/x37009.xml</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Fri, 04 Sep 2009 14:44:25 GMT</pubDate><source url="http://spie.org" /></item><item><title>AcousTech Inc. Nondestructive Acoustic Micro Imaging/C-SAM and X-...
      </title><link>http://www.acoustech-inc.com/</link><description>To enable our customers to make informed and educated decisions about their parts and products, by providing the highest quality imaging services, and by supporting these services with our experience and knowledge base.</description><guid>http://www.acoustech-inc.com/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.acoustech-inc.com" /></item><item><title>Deep Ultraviolet (DUV) Optical Microscopes in UK</title><link>http://electronics.zibb.co.uk/suppliers/deep+ultraviolet+(duv)+optical+microscopes/gb/25692973</link><description>Deep Ultraviolet (DUV) Optical Microscopes - UK Results - of 0 British Companies</description><guid>http://electronics.zibb.co.uk/suppliers/deep+ultraviolet+(duv)+optical+microscopes/gb/25692973</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Sun, 07 Oct 2007 00:00:00 GMT</pubDate><source url="http://electronics.zibb.co.uk" /></item><item><title>No Burn-In on Plasma and OLED TV thanks to ZeroBurn from IP Minin...
      </title><link>http://www.oled-display.net/no-burn-in-on-plasma-and-oled-tv-thanks-to-zeroburn-from-ip-mining</link><description>IP Mining Corp has launched a licensing program for the industry's only technology capable of eliminating burn-in on plasma and OLED TVs. The patented ZeroBurn® technology addresses the root cause of burn-in and thereby eliminates a product flaw that</description><guid>http://www.oled-display.net/no-burn-in-on-plasma-and-oled-tv-thanks-to-zeroburn-from-ip-mining</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Thu, 10 Sep 2009 00:00:00 GMT</pubDate><source url="http://www.oled-display.net" /></item><item><title>Euronetwork - HDMI Cables - Audio Visual Cables - Wall Plates - N...
      </title><link>http://www.euronetwork.co.uk/</link><description>We are the leading UK supplier of cables, wall plates, plug converters, voltage transformers, audio visual products (cables, adapters and accessories), networking (cables, connectors, adaptors, structured cabling, cabinets), telephone (cables, connectors, adapters) and USB (cables, adapters, hubs).</description><guid>http://www.euronetwork.co.uk/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.euronetwork.co.uk" /></item><item><title>DESIGNING AN ACCESSIBLE BOARD</title><link>http://www.edn-europe.com/designinganaccessibleboard+article+3491+Europe.html</link><description>One of the responsibilities of board-level designers is to ensure that verification and failure-analysis engineers have adequate access to signals without resorting to drills, bed-of-nails testers, or focused ion beams. This requirement used to be simple when pads were farther apart, chips were</description><guid>http://www.edn-europe.com/designinganaccessibleboard+article+3491+Europe.html</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.edn-europe.com" /></item><item><title>Google's Communication Failure Causes Bad Blood At Brown</title><link>http://blog.laptopmag.com/googles-communication-failure-causes-bad-blood-at-brown</link><description>Hundreds of students at 10 colleges who use Google Apps for email were affected by a bug in the system which allowed them to see emails and sometimes entire inboxes that were not their own. Google fix...&lt;img</description><guid>http://blog.laptopmag.com/googles-communication-failure-causes-bad-blood-at-brown</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate>Fri, 18 Sep 2009 16:18:28 GMT</pubDate><source url="http://blog.laptopmag.com" /></item><item><title>Brosz and Associates - Forensic Electrical Engineers and Scientis...
      </title><link>http://www.brosz.net/</link><description>brosz &amp; associates, electrical experts, forensic engineers and scientists - electrical testing and commissioning brosz &amp; associates, electrical experts, forensic engineers and scientists - electrical testing and commissioning home profile services facilities library gallery artifacts affiliations</description><guid>http://www.brosz.net/</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.brosz.net" /></item><item><title>Made By Monkeys</title><link>http://www.electronicsweekly.com/blogs/engineering-design-problems</link><description>..the energy density of lithium-ion batteries used for laptop computers, at 40 watt-hours per kilogram, was already getting uncomfortably close to that of your basic hand grenade."</description><guid>http://www.electronicsweekly.com/blogs/engineering-design-problems</guid><category domain="http://www.zibb.com">Electronics/Test &amp; Measurement/Failure Analysis</category><pubDate /><source url="http://www.electronicsweekly.com" /></item></channel></rss>