Audio
X-Rays Measure Locally Strained Silicon
Michael Hecker, senior materials analyst at AMD Saxony, says that local measurement of the strain state is essential for developing improved device structures.
AMD's Grose Considers 450 mm Wafers, SOI
Doug Grose, senior vp of manufacturing and supply chain management at AMD, discusses his perspectives on the wafer size debate, bulk silicon vs. SOI, manufacturing productivity, and more.
High-k Metal Gate Has Scalability, Implementation Issues
Raj Jammy is an IBM assignee working at Sematech as director of the Front End Processes Division. In this interview, he evaluates some of the materials and design hurdles facing the implementation of high-k/metal gate beyond 32 nm.
Results 1-3 of 3
Page:
