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Optical Microscopy Is Pushed Beyond Diffraction Limits

Audio  |  www.semiconductor.net | Apr 17, 2007

Yannick De Wilde, who leads research at the Laboratoire d'Optique Physique, shows how a subwavelength scanning probe enables NSOM to be used to investigate materials' properties.

http://www.semiconductor.net/podcast/SI_On_the_Scene/1866-Optical_Microscopy_Is_Pushed_Beyond_Diffraction_Limits.php?rssid=20244

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