Events
ET 21 Exhibition Theatre: Tuesday 21st April, 2009 | DATE - Design, Automation and Test in Europe
The Design, Automation, and Test in Europe (DATE) conference is the worlds premier conferences dedicated to electronic and embedded systems.
A Programmable and Low-EMI Integrated Half-Bridge Driver IN BCD Technology
A Programmable and Low-EMI Integrated Half-Bridge Driver in BCD Technology F. D'Ascoli1 , L. Bacciarelli1 , M. Melani1 , L. Fanucci1 , G. Ricotti2 , E. Pardi3 , F. Vincis3 , M. Forliti3 , M. De Marinis3 1 Dept. of Information Engineering, University of Pisa, Pisa, Italy 2 STMicroelectronics,
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies G. Gielen, P. De Wit, E. Maricau, J. Loeckx Departement Elektrotechniek ESAT-MICAS Katholieke Universiteit Leuven, Belgium gielen@esat.kuleuven.be 1 on leave from Universitat Autonoma de Barcelona, Spain J. Mart´ ın-Mart´
EMC-Aware Design on a Microcontroller for Automotive Applications
EMC-aware Design on a Microcontroller for Automotive Applications Patrice Joubert Doriol† , Yamarita Villavicencio‡ , Cristiano Forzan† , Mario Rotigni† , Giovanni Graziosi† , and Davide Pandini† † STMicroelectronics, Agrate Brianza, 20041 Italy ‡ Politecnico di Torino, Torino, 10129 Italy
A Novel Approach for EMI Design of Power Electronics
A Novel Approach for EMI Design of Power Electronics Bernd Stube 1 Bernd Schroeder 1 Eckart Hoene 2 Andre Lissner 2 1 Mentor Graphics Corporation, System Design Division, Berlin, Germany {Bernd_Stube, Bernd_Schroeder}@mentor.com 2 Fraunhofer Institute for Reliability and Microintegration, System
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