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Engineering Automation
Knowledge-Based Engineering System Reduce Design Time, Errors and Cost
Upcoming Event - Design, Automation, and Test in Europe 2008 (DATE 08)
Event | www.date-conference.com | Apr 16, 2009
The Design, Automation, and Test in Europe (DATE) conference is the worlds premier conferences dedicated to electronic and embedded systems.
Microprocessor Test and Verification (MTV'09)
Event | www.edn.com | Jun 15, 2009
The purpose of MTV'09 is to bring together researchers and practitioners from all areas of work related to verification and test in order to exchange innovative ideas and present new methodologies for solving the challenges facing us today in various processor and SOC design environments. The
Exhibitions-and-Conferences/Online-Seminar-to-Look-At-Development-and-Enhancement-of-Packaging-Through-Nanotechnology
Event | www.electronicspecifier.com | Nov 21, 2009
Online Seminar to Look At Development and Enhancement of Packaging Through Nanotechnology : Electronics News from Electronic Specifier
Engineering of Nanostructures from Carbon Nanotubules
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http://www.foresight.org/conference/MNT05/Papers/Sinnott/index.html
Events - Electronics Design, Strategy, News | EDNAsia.com
Event | www.ednasia.com
Ednasia.com is the leading Web site for design engineers in the electronics industry. It carries top stories of the day including technological breakthroughs, and product news on a daily basis. Reaching out to design engineers throughout Asia and the rest of the world, ednasia.com is the essential
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Daimler, John Deere and Labinal to deliver keynotes at the 2010 International LMS Simulation Conference (LMS International)
Event | www.lmsintl.com | Sep 29, 2009
Daimler, John Deere and Labinal to deliver keynotes at the 2010 International LMS Simulation ConferenceFrom: LMS InternationalType: Press Release
Delphi Electronics and Safety
Author: Madhusudhana I.P., Technical Leader, Delphi Electronics and Safety, Bangalore – India Abstract: Embedded software has become an integral part of present-day motor vehicles.
Back-to-Basics: Channel modeling and 'what if' analysis for signal integrity applications
Event | www.tmworld.com | Dec 12, 2008
Date: Thursday January 15, 2009 (available on demand until January 15, 2010)Time: 15:00 Central Europe Time, 2PM UK GMT, 9AM EST, 8AM CSTSponsored by: Agilent Technologies, EDN Europe, and Test & Measurement World.Presenter: Colin Warwick, signal integrity product manager at the EEsof division of
The 46th Design Automation Conference in San Francisco
Event | www2.electronicproducts.com | Jul 1, 2009
One can be certain that DAC is always an interesting conference Those attending DAC 2009 (July 26 to 31)
TES, LLC - Your Authorized SolidWorks Training and Support Center
Come check out SW 2009 and judge for yourself whether this newest version is the highest-performing CAD software you have ever seen.

