Events
VPG to Present Tutorial on Precision Resistors and ESD Issues at 2011 CMSE Conference : Electronics
VPG to Present Tutorial on Precision Resistors and ESD Issues at 2011 CMSE Conference : Electronics News from Electronic Specifier
A Design Methodology for Fully Reconfigurable Delta-Sigma Data Converters
A Design Methodology for Fully Reconfigurable Delta-Sigma Data Converters Yi Ke1 , Jan Craninckx2 , Georges Gielen1 1 Katholieke Universiteit Leuven, ESAT-MICAS, Kasteelpark Arenberg 10, B-3001 Leuven 2 IMEC, Kapeldreef 75, B-3001 Leuven Yi.Ke, Georges.Gielen@esat.kuleuven.be Abstract- This
Low Power Analogue 90 Degree Phase Shifter
Low Power Analogue 90 Degree Phase Shifter Peter H. Saul, Saul Research peter@saulresearch.com Abstract This paper describes a re-useable circuit module for a 900 phase shifter, sometimes called a “Hilbert Transformer”, which has been demonstrated on a 0.35-micron CMOS process. The 10-pole
Assessing the Cost Effectiveness of Integrated Passives
Assessing the Cost Effectiveness of Integrated Passives Michael Scheffler, Gerhard Tr¨ oster Electronics Lab, ETH Zurich, Gloriastr. 35, 8092 Zurich Ph: +41 1 63 25829, Fx: 21210, eMail: scheffler@ife.ee.ethz.ch httpwww.ife.ee.ethz.ch/mcm/ Abstract Passive components integrated into a high-density
Non-linear Components for Mixed Circuits Analog Front-End
Non-linear Components for Mixed Circuits Analog Front-End Luigi Carro, Adão Souza Jr., Marcelo Negreiros, Gabriel Jahn, Denis Franco* Departamento de Engenharia Elétrica - UFRGS *Instituto de Informática - UFRGS Av. Osvaldo Aranha, 103 CEP: 90035-190 Porto Alegre – RS - Brazil carro@iee.ufrgs.br
Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach
Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach R. Kheriji1,2 , V. Danelon1 , J.L. Carbonero1 and S. Mir2 1 ST Microelectronics, 850 Rue Jean Monnet, 38926, CROLLES, France 2 TIMA laboratory, 46 Avenue Felix VIALLET, 38031 GRENOBLE, France Abstract This paper is
Parameter Controlled Automatic Symbolic Analysis of Nonlinear Analog Circuits
Parameter Controlled Automatic Symbolic Analysis of Nonlinear Analog Circuits Ralf Popp, Joerg Oehmen, Lars Hedrich, Erich Barke Institute of Microelectronic Circuits and Systems, University of Hannover, Germany [popp,oehmen,hedrich,barke]@ims.uni-hannover.de Abstract In this paper we introduce
Design For Testability Method for CML Digital Circuits
Design For Testability Method for CML Digital Circuits Bernard Antaki‡ , Yvon Savaria‡ , Saman M. I. Adham† and Nanhan Xiong‡ ‡Ecole Polytechnique, C.P. 6079, succ. Centre-Ville, Montreal, Quebec, Canada, H3C 3A7 † Nortel Networks, P.O. Box 3511, Station C, Ottawa, Ontario, Canada K1Y 4H7
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