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EDA Consortium

logo Header www.edac.org Site Map Contact Home EDAC Past Event Presentations 2010 Events February - 2010 EDA Consortium Annual CEO Forecast and Industry Vision April - EDA Consortum Spring

Sister Events | DATE - Design, Automation and Test in Europe

The Design, Automation, and Test in Europe (DATE) conference is the worlds premier conferences dedicated to electronic and embedded systems.

Meet MDA at DAC 2010

MDA Home the designer-centric approach MDA home Contact site-map News Home Solutions Products Company Partners Contact News Events Login Meet MDA at DAC 2010 Home > Events > dac10 MDA will be exhibiting at the

Cortus will be exhibiting their APS3 32 bit processor core at the Design Automation Conference 2011

Cortus to show APS3 32 bit processor core at the Design Automation Conference 2011 (DAC), San Diego 6th-8th June : Electronics News from Electronic Specifier

EDAC

logo Header Site Map Contact Home Past EDA Consortium events on video, PowerPoint &/or audio. Click below for the event of interest: 2006 Events Nov. - Doing Business in India Nov - Annual Dinner & Kaufman Award

EDA Consortium

logo Header www.edac.org DAC Executive Welcome Reception Join leaders of the EDA industry at the DAC Sunday Night Welcome and General Chair's Reception for a lively evening of networking with a diverse group of colleagues for this

Microsoft PowerPoint - DAC 2004 presentation rev4 elolkd.ppt

1 EDA and Export Update Presented by Larry Disenhof Director, Export Compliance Cadence Design Systems Erik Oliver Senior IP Counsel Synopsys, Inc. 2 EDA EDA EDA CONSORTIUM CONSORTIUM CONSORTIUM Agenda Export compliance overview Developments since DAC 2003 Export controls and EDA Emerging issues

BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated

BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits Amir Zjajo1 , Manuel J. Barragan Asian2 , Jose Pineda de Gyvez1,3 1 Philips Research Laboratories, HighTech Campus 5, 5656 AE Eindhoven, The Netherlands 2 Instituto de Microelectronica de

Behavioural Modelling and Simulation of Delta Sigma Modulators Using Hardware Description Languages

Behavioural Modelling and Simulation of Σ∆ Modulators Using Hardware Description Languages R. Castro-López1 , F. V. Fernández1,2 F. Medeiro1,2 and A. Rodríguez-Vázquez1,2 1IMSE-CNM, Edif. CICA, Avda. Reina Mercedes s/n, E-41012 Sevilla, SPAIN Phone: +34 955056666, FAX: +34 955056686, e-mail:

A Programmable and Low-EMI Integrated Half-Bridge Driver IN BCD Technology

A Programmable and Low-EMI Integrated Half-Bridge Driver in BCD Technology F. D'Ascoli1 , L. Bacciarelli1 , M. Melani1 , L. Fanucci1 , G. Ricotti2 , E. Pardi3 , F. Vincis3 , M. Forliti3 , M. De Marinis3 1 Dept. of Information Engineering, University of Pisa, Pisa, Italy 2 STMicroelectronics,

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