Events
4.6 System Approaches to Flash Memory Management | DATE - Design, Automation and Test in Europe
The Design, Automation, and Test in Europe (DATE) conference is the worlds premier conferences dedicated to electronic and embedded systems.
A P1500-compatible programmable BIST approach for the test of Embedded Flash Memories
A P1500-compatible programmable BIST approach for the test of Embedded Flash Memories P. Bernardi, M. Rebaudengo, M. Sonza Reorda, M. Violante Politecnico di Torino Dipartimento di Automatica e Informatica Torino, Italy httpwww.cad.polito.it/ Abstract In this paper we present a
Using Non-Volatile Memory to Save Energy in Servers
Using Non-Volatile Memory to Save Energy in Servers David Roberts University of Michigan Department of CSE Advanced Computer Architecture Lab daverobe@umich.edu Taeho Kgil Intel Corporation taeho.kgil@intel.com Trevor Mudge University of Michigan Department of CSE Advanced Computer Architecture
Architecture Exploration of NAND Flash-Based Multimedia Card
Architecture Exploration of NAND Flash-based Multimedia Card Sungchan Kim School of EECS Seoul National University, Korea sungchan.kim@iris.snu.ac.kr Chanik Park Memory division Semiconductor Business Samsung Electronics Co., Korea ci.park@samsung.com Soonhoi Ha School of EECS Seoul National
Dynamic Code Overlay of SDF-Modeled Programs on Low-end Embedded Systems
Dynamic Code Overlay of SDF-Modeled Programs on Low-end Embedded Systems Hae-woo Park Kyoungjoo Oh Soyoung Park Myoung-min Sim Soonhoi Ha School of EECS, Seoul National University, Seoul, Korea {starlet, kjoh, soy, min, sha}@iris.snu.ac.kr Abstract In this paper we propose a dynamic code
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