Events
Microsoft Word - PathwaysAndCancer_ProccStyle.doc
Can We Identify Cellular Pathways Implicated in Cancer Using Gene Expression Data? Nigam Shah1 , Jorge Lepre2 , Yuhai Tu2 and Gustavo Stolovitzky2* 1 Pennsylvania State University, University Park, PA 16802, USA, 2 IBM Computational Biology Center, T.J. Watson Research Center, PO Box 218, Yorktown
Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications
Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications D.C. Keezer1 , D. Minier2 , P. Ducharme2 1- Georgia Institute of Technology, Atlanta, Georgia USA 2 – IBM, Bromont, Canada Abstract The ability to precisely control the timing of digital signals
Stretching the Limits of FPGA SerDes for Enhanced ATE Performance
Stretching the Limits of FPGA SerDes for Enhanced ATE Performance A.M. Majid, D.C. Keezer School of Electrical and Computer Engineering Georgia Institute of Technology Atlanta, GA, USA Abstract – This paper describes a multi-gigahertz test module to enhance the performance capabilities of
Ultralow Power Computing with Sub-Threshold Leakage: A Comparative Study of Bulk and SOI
Ultralow Power Computing with Sub-threshold Leakage: A Comparative Study of Bulk and SOI Technologies A. Raychowdhury, B. C. Paul, S. Bhunia$ , K. Roy Electrical and Computer Engineering, Purdue University, IN $ Electrical Engineering and Computer Science, Case Western Reserve University, OH
SubCALM: A Program for Hierarchical Substrate Coupling Simulation on Floorplan Level
SubCALM: A Program for Hierarchical Substrate Coupling Simulation on Floorplan Level Thomas Brandtner Infineon Technologies Development Center Villach, Austria thomas.brandtner@infineon.com Robert Weigel Chair of Electronics University of Erlangen-Nuremberg, Germany
Demonstration of a SiGe RF LNA Design using IBM Design Kits in 0.18um SiGe BiCMOS Technology
Demonstration of a SiGe RF LNA Design using IBM Design Kits in 0.18um SiGe BiCMOS Technology Yiming Chen, Xiaojuen Yuan, David Scagnelli*, James mecke, Jeff Gross*, David Harame* IBM Microelectronics Division, San Diego, California, USA IBM Microelectronics Division BTV, Vermont, USA*
Analyzing the Impact of Process Variations on Parametric Measurements: Novel Models and Applications
Analyzing the Impact of Process Variations on Parametric Measurements: Novel Models and Applications Sherief Reda Division of Engineering Brown University Providence, RI 02912 Email: sherief reda@brown.edu Sani R. Nassif Austin Research Laboratory IBM Corporation Austin, TX 78758 Email:
Page:
