Events Results 1-8 of 8

Carbon Nanotube Integration within Electronic Devices

New methods for fast, accurate, and inexpensive identification of failed integrated circuits (ICs) on electronic circuit boards have been recently a subject of intensive research.

http://www.foresight.org/conference/MNT9/Abstracts/Wright/index.html

2nd IEEE International Workshop- Call for Papers on Test & Measurement World Proposals due August

Event  |  www.tmworld.com

The workshop will focus on Automated Test Equiptment, and where the futture of the industry is headed. The goal of this workshop is to create an informal forum to discuss relevant innovations to ATE developers and users. The workshop is looking for solutions to challenges the industry faces for

http://www.tmworld.com/event/2140248675.html

Carbon Nanotube-based Sensor Devices

Presently, testing of these boards is accomplished through the use of expensive and time-consuming process involving automatic test equipment (ATE) controlled by test program sets (TPS).

http://www.foresight.org/conference/MNT10/Abstracts/Wright/index.html

Integrated Circuit Molecular Test Equipment

This paper describes original development efforts that are currently underway for the design, simulation, and development of nanotechnology-based molecular test equipment (MTE).

http://www.foresight.org/conference/MNT8/Abstracts/Wright/index.html

Results 1-8 of 8

Want to put this widget on your blog or personal homepage? Choose your site from the list below.
Add to Google
Or copy the embed script code below and paste it on your website:
Embed code:
>