ATE Selection, Design and...

Event  |  www.tmworld.com | Jan 22, 2008

From a quick introduction of ATE, the course goes on to test strategies, requirements, and specifications. Topics include stimulus measurements, switching instruments, and IEEE 488, PC, VXI, PXI, and LXI buses. The course provides a structured approach to test program development in which the

http://www.tmworld.com/event/5854-ATE_Selection_Design_and_Programming.php?rssid=20430

Carbon Nanotube Integration within Electronic Devices

New methods for fast, accurate, and inexpensive identification of failed integrated circuits (ICs) on electronic circuit boards have been recently a subject of intensive research.

http://www.foresight.org/conference/MNT9/Abstracts/Wright/index.html

Live Webcast: ATE System Refresh/Upgrade...An Implementation "Monster"

Event  |  www.home.agilent.com | Sep 9, 2009

But how can the risks associated with software/test program set (TPS) migration and test system / process change be addressed? • What are the most-important ATE system refresh considerations? • What are the options for addressing hardware obsolescence / upgrade?

http://www.home.agilent.com/agilent/eventDetail.jspx?cc=US&lc=eng&ckey=1683870&nid=-35198.0.08&id=1683870&cmpid=1151

ElectronTechExpo :: Exhibitors 2008

Deliveries of special high-precision crystals, oscillators and filters, including special-purpose items (industrial and military). Deliveries of equipment for microelectronics. Systems integration. We also have our own design and production facilities.

http://www.primexpo.ru/expoelectronica/eng/exhibitors_et.shtml?34

On-demand Webcast: ATE System Refresh/Upgrade - An Implementation "Monster"

Event  |  agilent.webex.com | Oct 7, 2009

But how can the risks associated with software/test program set (TPS) migration and test system / process change be addressed? What are the most-important ATE system refresh considerations? What are the options for addressing hardware obsolescence / upgrade?

https://agilent.webex.com/ec0600l/eventcenter/recording/recordAction.donJ0TKwnZ7c5jDL6Fy4TfzsvWGtzsHyhG5PNhJHTmmf8mMMwbw7NH!-1381103540?theAction=poprecord&actname=%2Feventcenter%2Fframe%2Fg.do&renewticket=0&renewticket=0&apiname=lsr.php&actappname=ec0600l&cmpid=1151&entappname=url0106l&needFilter=false&&isurlact=true&rID=58032867&entactname=%2FnbrRecordingURL.do&rKey=b33b48d292007430&recordID=58032867&siteurl=agilent&rnd=7044523886&SP=EC&AT=pb&format=short

Integrated Circuit Molecular Test Equipment

This paper describes original development efforts that are currently underway for the design, simulation, and development of nanotechnology-based molecular test equipment (MTE).

http://www.foresight.org/conference/MNT8/Abstracts/Wright/index.html