Events
Get the total Coverage at Electronica 2008 : Electronics News from ElectronicSpecifier
Get the total Coverage at Electronica 2008 : Electronics News from Electronic Specifier
Environmental Test Chambers | ESPEC North America
ESPEC provides environmental test chambers for quality assurance testing of products in temperature and humidity extremes, including 18 benchtop test chambers.
A Systematic Approach to the Test of Combined HW/SW Systems
A Systematic Approach to the Test of Combined HW/SW Systems Alexander Krupp, Wolfgang M¨ uller Paderborn University / C-LAB, Paderborn, Germany Abstract—Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the
Aerospace Testing 2011 > Events : Tektronix
Event Location: Messe Hamburg, Germany --> Come and see Tektronix at the Aerospace Testing 2011 exhibition in Hamburg at our booth H41, hall 4B and see our range of products.Join us at our booth!
Pushing the Limits of Accelerometer Size and Power STMicroelectronics Unveils Details of New MEMS
Pushing the Limits of Accelerometer Size and Power: STMicroelectronics Unveils Details of New MEMS Accelerometer Family : Electronics News from Electronic Specifier
Test and Reliability Challenges in Automotive Microelectronics
Panel: Test and Reliability Challenges in Automotive Microelectronics Moderator: C. Sebeke, Robert Bosch GmbH, DE Panelists: C. Jung, BMW Group, DE K. Harbich, Robert Bosch GmbH, DE S. Fuchs, Credence Systems GmbH, DE J. Schwarz, DaimlerChrysler AG, DE P. Goehner, Stuttgart U, DE Abstract
Model-Based Testing of Automotive Electronics
Model-Based Testing of Automotive Electronics Dr.-Ing. Klaus Lamberg dSPACE GmbH, Paderborn, Germany klamberg@dspace.de 1. Role of Testing throughout the Development of Automotive Electronics The increasing importance of electronics in the automotive industry is illustrated by the growing
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