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Thin Semiconductor Layers from Langmuir-Blodgett Precursor
*, 1Fondazione El.B.A., Corso Europa 30, Genova, 16132, Italy 2Institute of Biophysics, University of Genova, Corso Europa 30, Genova 16132, Italy 3Polo Nazionale Bioelettronica, Via Roma 28, Marciana (Li), 57030, Italy *Corresponding author: erokhin@ibf.unige.
http://www.foresight.org/conference/MNT6/Papers/Erokhin/index.html
VJ Inspection Systems |2008 Tradeshow Calendar
VJ Inspection Systems X-Ray Inspection Technology PRODUCTS SERVICES APPLICATIONS 2009 Trade Show Calendar International Tradeshows DATE LOCATION EXPO BOOTH Mar18-20, 2009 Moscow, Russia RUSSIA NDTLAB 2009 B24 Nov 8-11, 20099 Kingdom of Bahrain 5th Middle East NDT Conference (MENDT) F12 Domestic
SMART Group
Keep up to date with the SMART Group events through out the year, find out what has been going on in the industry and what technical issues are being debated. If you would like to host an event at your facility or take a tabletop exhibition stand at one of our events contact SMART Group
Nikon Instruments Inc. | Events | European Events Calendar | Microscopy Cube - SEM & MA200 Tour
Nikon Instruments Inc. | Americas Search This Site Global Site Skip to main content Home Products Applications Information Center News Events Support Where To Buy About European Events Calendar Microscopy Cube - SEM & MA200 Tour Nikon Instruments / Events / European Events Calendar / Microscopy
http://www.nikoninstruments.com/Events/European-Events-Calendar/Microscopy-Cube-SEM-MA200-Tour
Event details: 9th International Conference on X-Ray Microscopy - XRM2008 - nanotechweb.org
Click here to view our webinar from NanoInk. Inc, entitled Using Molecular Building Blocks to Create Features in the Nanoworld: Dip Pen Nanolithography.
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Event details: SPIE Scanning Microscopy 2009 - optics.org
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Expoelectronica :: Exhibitors 2008
SYSTEM FOR MICROSCOPY AND ANALYSIS is an authorized agency of FEI Company, EDAX Inc., PHI. We offer scanning and transmission electron microscopes, unique focused ion beam systems, x-ray micro-analyzers, devices for high-precision chemical and elementary analysis.
http://www.primexpo.ru/expoelectronica/eng/exhibitors_ee.shtml?342
Making electrical contact to single molecules
by Wolfgang Fritzsche1*, Konrad J. Böhm2, Eberhard Unger2, J. Michael Köhler1 1Microsystems Department, Institute of Physical High Technology, P.O. Box 100 239, 07702 Jena, Germany 2Research Group Molecular Cytology / Electron Microscopy, Institute of Molecular Biotechnology, P. O.
http://www.foresight.org/conference/MNT05/Papers/Fritzsche/index.html
Scanning Probe Microscopy studies of ultra flat gold surfaces for use in Chemical Force Microscopy
The preparation of ultra flat gold surfaces for use in chemical force microscopy (CFM) has been studied. The surfaces were studied in terms of substrate effects by comparing mica, Si (110) wafer and glass slides. The effect of different annealing regimes was also investigated.
http://www.foresight.org/conference/MNT7/Abstracts/Masens2/index.html
Scanning Probe Microscopy investigations of nano-composite materials
Nano-composites are a class of materials that has gained much interest recently. The potential of producing materials with tailored physical and electronic properties at low cost are attractive for applications ranging from drug delivery to corrosion prevention.
http://www.foresight.org/conference/MNT7/Abstracts/Nyffenegger/index.html
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