Events
TS 900 Geotest to Showcase PXI Semiconductor Test System TS 900 at productronica 2011 : Electronics
Geotest to Showcase PXI Semiconductor Test System TS-900 at productronica 2011 : Electronics News from Electronic Specifier
LXI Consortium Members Mtg & PlugFest 4/25-2/28
Technical Committee LXI Consortium Business 8:30 9:00 Opening welcome and Intoductions (Bob Rennard, Jochen Wolle, Paul Franklin) 9:00 11:00 Resource Management (David Poole) 11:00 12:00 IEEE 1588 conference recap (John Eidson) 12:00 1:00 1:00 3:00 IEEE 1588v2 in LXI spec (John Eidson) Plug
LXI | LAN eXtensions for Instrumentation | Past Events
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Agilent Technologies to Demonstrate Industry First USB 30 Tests with NEC Electronics USB 30 Host
Agilent Technologies to Demonstrate Industry-First USB 3.0 Tests with NEC's USB 3.0 Host Controller at Developers Conference : Electronics News from Electronic Specifier
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