Events
ICT-eMuCo | DATE - Design, Automation and Test in Europe
The Design, Automation, and Test in Europe (DATE) conference is the worlds premier conferences dedicated to electronic and embedded systems.
IPC Apex 2012 San Diego Booth 3307 for Market Leader JTAG Technologies A bundle of brand new
Preview for IPC Apex 2012, San Diego, Booth # 3307 for Market Leader JTAG Technologies A bundle of brand new solutions for the Design, Engineering and Production Industry : Electronics News from Electronic Specifier
Lets Test 8213 Meet Acculogic at the 2012 IPC APEX Expo for a Demonstration : Electronics News from
Let s Test ― Meet Acculogic at the 2012 IPC APEX Expo for a Demonstration : Electronics News from Electronic Specifier
MTS500 Preview for the print media for Digitaltest Inc for productronica 2011 Munich Showgrounds
Preview for the print media for Digitaltest Inc for productronica 2011, Munich Showgrounds, Hall A1, Booth A1.365, November 15th to 18th, 2011 : Electronics News from Electronic Specifier
Get the total Coverage at Electronica 2008 : Electronics News from ElectronicSpecifier
Get the total Coverage at Electronica 2008 : Electronics News from Electronic Specifier
The Road to Energy-Efficient Systems: From Hardware-Driven to Software-Defined
The Road to Energy-Efficient Systems: From Hardware-Driven to Software-Defined Cool Electronic Systems Special Day Panel Session Gerhard Fettweis (Organizer/Moderator) Vodafone Chair Mobile Communications Systems TU Dresden, Germany fettweis@ifn.et.tu-dresden.de Abstract—Innovations in micro and
Evaluation of Test Measures for LNA Production Testing Using a Multinormal Statistical Model
Evaluation of test measures for LNA production testing using a multinormal statistical model J. Tongbong 1 , S. Mir 1 and J.L. Carbonero² 1 TIMA Laboratory 46 Avenue Félix Viallet 38031 Grenoble, France ²ST Microelectronics 850 Rue Jean Monnet 38926 Crolles, France Abstract For Design-For-Test
Extending JTAG for Testing Signal Integrity in SoCs
Extending JTAG for Testing Signal Integrity in SoCs N. Ahmed, M. Tehranipour, M. Nourani Center for Integrated Circuits & Systems The University of Texas at Dallas Richardson, TX 75083-0688 nxa018600,mht021000,nourani ¡@utdallas.edu Abstract As the technology is shrinking and the working
SoC Design and Test Considerations
1 of 6 Abstract: Modern SoC Design for high-volume products requires a strong focus on Design-for-Test and Designfor-Manufacturability. We present a case study of an SoC test concept, including a description of the DfT and DfM features included in the SoC device and a brief motivation for their
Testable Design for Advanced Serial-Link Transceivers
Testable Design for Advanced Serial-Link Transceivers Mitchell Lin, Kwang-Ting (Tim) Cheng Department of Electrical and Computer Engineering University of California, Santa Barbara leitz@ece.ucsb.edu Abstract This paper describes a DfT solution for modern seriallink transceivers. We first
