Chip Inspection, Test & Measurement News

News

Cirrus Logic Energy Measurement ICs Offer Lowest Cost Solution While Optimizing Performance for
www.cirrus.com | 5 hours 18 minutes ago
Cirrus Logic unveils family of AFE ICs for single/polyphase energy meters for smart grid.

Power Measurement SoC monitors 3-phase POL applications., Maxim Integrated Products
news.thomasnet.com | Feb 10, 2012
New SoC Enables Measurement and Diagnostics for High-Power Monitoring in Industrial Applications and Data Centers, Maxim Integrated Products

Keithley Publishes 2012 Test Measurement Product Catalog : Electronics News from ElectronicSpecifier
www.electronicspecifier.com | Feb 8, 2012
Keithley Publishes 2012 Test & Measurement Product Catalog : Electronics News from Electronic Specifier

Strong semi growth - except for DRAM, says ESIA
www.electronicsweekly.com | Feb 3, 2012
European semiconductor sales in December amounted to $ 2.8bn - 5.5% down on November, reports the European SIA citing WSTS figures.

Advances in 3D-IC testing
www.eetasia.com | Feb 3, 2012
Read about the design-for-3D-test architecture and implementation flow developed by researchers at Industrial Technology Research Institute based on the Synopsys test solution.

Define drain-current conditions when calculating power for multi-core SoCs
cdn.eetimes.com | Jan 27, 2012
Define drain-current conditions when calculating power for multi-core SoCs

Sequans Communications Certifies The R&S CMW500 Wideband Radio
www.rfglobalnet.com | Jan 24, 2012
Sequans Communications Certifies The R&S CMW500 Wideband Radio Communication Tester For The Alignment Of Its LTE Chipsets - Rohde & Schwarz

I-Micronews - ADVANCED PACKAGING: 3D IC, WLP & TSV : The fast track to 3D-IC testing...
www.i-micronews.com | Jan 19, 2012
Three-dimensional integrated circuit (3D-IC) systems offer the potential to deliver significant improvements in performance, power, functional density, and form factor over other packaging integration techniques. Despite substantial progress toward realizing 3D-IC systems, a variety of design,

Altair Semiconductor Releases Production Test Tool Based on the Rohde &Schwarz CMW500, Optimized
www.altair-semi.com | Jan 16, 2012
Altair Semiconductor releases production test tool for 4G chipsets based on Rohde & amp; Schwarz CMW500.

Agilent | Agilent Technologies Announces Industry's First High-Speed Inter-Chip Compliance Test
www.agilent.com | Jan 16, 2012
Agilent Technologies Announces Industry's First High-Speed Inter-Chip Compliance Test Software for Real-Time Oscilloscopes