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BAE Systems, National Instruments and Phase Matrix Inc. Introduce 26.5 GHz PXI Synthetic Instrument
Press Release | www.prnewswire.com | 4 hours 58 minutes ago
New RF/Microwave Downconverter Modules Developed for Use in Commercial and Military Applications SALT LAKE CITY, Sept. 8, 2008 /PRNewswire-FirstCall/ -- AUTOTESTCON -- BAE Systems, National Instruments (Nasdaq: NATI) and Phase Matrix Inc. today announced the availability of a next-generation, 26.
http://www.prnewswire.com/cgi-bin/stories.pl?ACCT=109&STORY=/www/story/09-08-2008/0004880656&EDATE=
Test Research Inc. Brings AXI to Globaltronics
News | www.emsnow.com | 18 hours 58 minutes ago
New AOI, SPI and In-Circuit Tester Models Will Also Be Shown Test Research Inc. (TRI, TAIEX 3030) announced that it would showcase the new TR7600 Automated X-ray Inspection (AXI) test system at Globaltronics Singapore from September 9-12, 2008.
Test-and-Measurement/TI-driving-forward-new-IEEE-11497-standard
News | www.electronicspecifier.com | Sep 6, 2008
TI driving forward new IEEE 1149.7 standard : Electronics News from Electronic Specifier
The Shuman Law Firm Encourages Holders of Eagle Test Systems, Inc. to Consider Their Legal Options (GlobeNewswire)
News | biz.yahoo.com | Sep 5, 2008
The Shuman Law Firm Encourages Holders of Eagle Test Systems, Inc. to Consider Their Legal Options. - BOULDER, Colo., Sept. 5, 2008 (GLOBE NEWSWIRE) -- Advertising Material -- The Shuman Law Firm today announced that it is investigating the proposed acquisition of Eagle Test Systems, Inc. (``Eagle
Tool Order: SUSS MicroTec wins 300mm ProbeShield system order
News | www.fabtech.org | Sep 5, 2008
A major Asian memory manufacturer has placed an order with SUSS MicroTec Test Systems for a 300mm wafer-level probe system, the PA300PS.
http://www.fabtech.org/news/_a/tool_order_suss_microtec_wins_300mm_probeshield_system_order/
Keithley receives industry award for semiconductor measurement system
News | www.tmworld.com | Sep 5, 2008
Keithley Instruments has been awarded the Editor's Choice Best Product Award from Semiconductor International magazine for its Model 4200-CVU Semiconductor Measurement System.
Setcom Wireless : LTE test system goes from research to conformance testing
News | www.dspdesignline.com | Sep 5, 2008
Setcom Wireless has announced the S-CORE conformance and research test environment for LTE (Long Term Evolution) protocol testing and monitoring.
http://www.dspdesignline.com/210500332?cid=RSSfeed_dspdesignline_dspdlRSS
Single test system for LTE debuts
News | www.eetasia.com | Sep 5, 2008
setcom wireless positions the S-CORE conformance and research test environment for LTE protocol testing and monitoring.
http://www.eetasia.com/ART_8800542827_499488_NP_a081e006.HTM
PartnerTech partners with Snap-On on auto emissions tester
News | www.evertiq.com | Sep 4, 2008
Snap-on Diagnostics, part of Snap-on Incorporated has selected PartnerTech to provide printed circuit board assembly, sub-system build and test services across its range of gas analyser and emissions products. - Created: 2008-09-04 10:01, By: Anke Schröter, Source: evertiq, Category: EMS
Rebuilt New Orleans Levees Pass First Hurricane Test
News | www.designnews.com | Sep 4, 2008
The engineering effort to rebuild New Orleans' levee system held up to Hurricane Gustav but there's major work ahead, including a new surge gate that will shore up the system to withstand a 100-year-level storm.
http://www.designnews.com/article/47976-Rebuilt_New_Orleans_Levees_Pass_First_Hurricane_Test.php
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