Design for Test & Built-in Self-Test News

News

Improve the tracking performance of the PWM voltage-controlled buck converters by using a passive
cdn.eetimes.com | 6 hours 39 minutes ago
Improve the tracking performance of the PWM voltage-controlled buck converters by using a passive pre-filter

Agilent | Agilent Technologies to Demonstrate Newest High-Speed Digital Design and Test Solutions
www.agilent.com | Jan 23, 2012
Agilent Technologies to Demonstrate Newest High-Speed Digital Design and Test Solutions at DesignCon 2012

GSE of Italy approves TÜV Rheinland to conduct testing for PV modules and systems | PV-Tech
www.pv-tech.org | Jan 11, 2012
GSE of Italy approves TÜV Rheinland to conduct testing for PV modules and systems

Taking full advantage of 8b/10b encoding in your USB 3.0 design
www.eetimes.com | Jan 5, 2012
Taking full advantage of 8b/10b encoding in your USB 3.0 design

Prototyping: Virtual vs physical
www.eetasia.com | Dec 15, 2011
Simulating and analyzing the products in software during the design process provides significant time-to-market and quality advantages over older practices of producing multiple physical prototypes and testing them in the lab.

Test Design Studio 2.0 Maintenance Release (Build 4586)
www.patterson-consulting.net | Dec 14, 2011
A new release of Test Design Studio 2.0 is available

I-Micronews - ADVANCED PACKAGING: 3D IC, WLP & TSV : Design and test challenges for 3DICs...
www.i-micronews.com | Dec 13, 2011
As the industry has lowered its chip-testing costs over the years, IC test has been predictable and somewhat dull. But in the emerging 2.5D and 3D chip era, IC test is entering the spotlight and the traditional test flow is under the gun.

Battery Sensor IC monitors vehicle battery condition., ZMDI
news.thomasnet.com | Nov 17, 2011
ZMDI Announces Industrys Smallest Intelligent Battery Sensor IC with Unique ADC Resolution and Lowest Sleep Mode Current, ZMDI

ARM, TSMC tape out 20-nm processor
www.edn.com | Oct 18, 2011
Processor IP licensor ARM and foundry TSMC have announced the completion of the design of an A15 processor test chip targeting implementation in a 20-nm manufacturing process technology.

ASTER adds Design to Test to their DfT Solutions : Electronics News from ElectronicSpecifier
www.electronicspecifier.com | Oct 17, 2011
ASTER adds Design-to-Test to their DfT Solutions : Electronics News from Electronic Specifier