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Failure Analysis - OCE
Failures/ Product Liability Expert Reports & Animations
Swansea nanotechnology center home for one of UK's most sophisticated electron-microscopes
News | www.nanowerk.com | Nov 17, 2009
Swansea nanotechnology center home for one of UK's most sophisticated electron-microscopes
Most security products not up to scratch
Press Release | www.theregister.co.uk | Nov 17, 2009
But most of all, you've let yourself downOnly four per cent (one in 25) information security products pass muster when first tested under a widely-used industry kitemark scheme.…<a
http://www.theregister.co.uk/2009/11/17/security_kit_testing_fail/
Magma Announces BoardView: Extends Chip-Based Navigation to Circuit- and Board-Level Debug -- Traces Signals Between Chips, PCBs or MCMs, Speeding Board-Level Failure Analysis
Press Release | investor.magma-da.com | Nov 16, 2009
"With the complexity of today's highly compressed PCB and MCM modules that use many chips, tracing the fault to its origin is not an easy task," said Ankush Oberai, vice president of Magma's Fab Analysis Business Unit.
http://investor.magma-da.com/releasedetail.cfm?ReleaseID=424395
Most Security Products Don't Initially Work As Intended, Study Says
News | www.darkreading.com | Nov 16, 2009
Many security products fail to perform as promised in initial certification tests
Magma Announces BoardView: Extends Chip-Based Navigation to Circuit- and Board-Level Debug
Press Release | www.edn.com | Nov 16, 2009
Magma(R) Design Automation (Nasdaq:LAVA - News), a provider of chip design software, today announced BoardView(TM), a new software that extends CAD navigation and circuit debug from integrated circuits (ICs) to printed circuit boards (PCBs) and multichip modules (MCMs).
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Camtek Announces Closing of the Acquisition of SELA - Semiconductor Engineering Laboratories Ltd -
Press Release | www.zibb.com | Nov 12, 2009
Camtek Ltd. (NASDAQ and TASE: CAMT), today announced that further to its announcement on September 24, 2009, regarding the signing of an agreement for the acquisition of the entire share capital of SELA - Semiconductor Engineering Laboratories Ltd. ("SELA"), it has completed the
Boundary scan and JTAG emulation combine for advanced structural test and diagnostics
News | www.embedded.com | Nov 11, 2009
While continuously improving IC and SoC technologies, higher clock rates, and more powerful processors are music to the design engineers' ears, the headaches of test engineers are getting worse and worse.
http://www.embedded.com/columns/technicalinsights/221601261?_requestid=208442
Industry-News/Celcite-expands-partnerships-in-Africa-to-deploy-its-multi-suite-network-performance-solution
Press Release | www.electronicspecifier.com | Nov 10, 2009
Celcite expands partnerships in Africa to deploy its multi-suite network performance solution : Electronics News from Electronic Specifier
Spectacles Give Researchers an Even Better Insight into Matter
News | www.azonano.com | Nov 5, 2009
An electron microscope with glasses that correct the spherical aberration of the lens in order to achieve even higher resolution is currently being assembled at the Electron Microscopy Centre (EMEZ). It is the first high-tech electron microscope of its kind in Switzerland.
FEI Sells Phenom Product Line
News | nanotechwire.com | Nov 4, 2009
FEI Company announced that Phenom-World, a majority-owned subsidiary of NTS Group B.V. (NTS) of Eindhoven, The Netherlands, has acquired FEI's Phenom product line. NTS has been FEI's manufacturing partner and was closely involved with the development of the innovative desktop scanning electron
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