Inspection News

News

In-Sight 500 Vision System - Cognex Corp. (photonics.com | Feb 2012 | Products)
www.photonics.com | Feb 13, 2012
Cognex Corp. has launched the In-Sight 500 machine vision system for inspecting parts on fast produc...

JPK reports on the current research activities of Dr Clemens Franz and his team at KIT
www.nanowerk.com | Feb 2, 2012
JPK reports on the current research activities of Dr Clemens Franz and his team at KIT

Materials Today - Carbon nanotube tips for AFM
www.materialstoday.com | Jan 26, 2012
The impact of scanning probe microscopy (SPM) over the past 20 years has been dramatic: its invention was, for example recently rated the second most important advance in materials science of the past 50 years.

Seeing an atomic thickness, Research, National Physical Laboratory - NanoTechWire.com - The online
nanotechwire.com | Jan 26, 2012
Scientists from NPL, in collaboration with Linköping University, Sweden , have shown that regions of graphene of different thickness can be easily identified in ambient conditions using Electrostatic Force Microscopy (EFM). The exciting properties of graphene are usually only applicable to the

Microscopes suit educational and routine applications., Olympus Europa Holding GmbH
news.thomasnet.com | Jan 19, 2012
Olympus Releases the New CX22 Series of Microscopes for Use in Educational and Routine Microscopy, Olympus Europa Holding GmbH

Viscom Holds Successful Open House at New Silicon Valley Facility : Electronics News from
www.electronicspecifier.com | Dec 9, 2011
Viscom Holds Successful Open House at New Silicon Valley Facility : Electronics News from Electronic Specifier

ViTrox’s V810 X-Ray Inspection System Named Best Product in Asia by Global Technology Awards | PRLog
www.prlog.org | Nov 24, 2011
ViTrox’s V810 X-Ray Inspection System Named Best Product in Asia by Global Technology Awards. The award was presented to the company during a Tuesday, November 15, 2011 ceremony that took place at the New Munich Trade Fair Centre in Munich, Germany during Productronica 2011. - PR11732543

Global Industrial X-Ray Inspection Systems Market to Reach US$591.9 Million by 2017
www.electronics.ca | Nov 18, 2011
Industrial x-ray inspection systems have emerged as one of the most lucrative segments of the global inspection systems market, primarily owing to the non-intrusive method of screening. X-ray inspection is gaining prominence as one of the most promising methods of non-destructive testing (NDT).

I-Micronews - PHOTONICS : Carl Zeiss MicroImaging a Carl Zeiss NTS to combine units to...
www.i-micronews.com | Nov 16, 2011
Changes in users needs and the market as well as technological innovations led Carl Zeiss MicroImaging GmbH and Carl Zeiss NTS to combine, forming a new division called Carl Zeiss Microscopy.

NT-MDT to Host Advanced Atomic Force Microscopy Technology Workshop at 2011 Fall Materials Research
www.prweb.com | Nov 14, 2011
NT-MDT will host an advanced Atomic Force Microscopy (AFM) technologies workshop at the 2011 Fall Materials Research Society meeting, lead by Dr. Sergei Magonov and Dr. Pavel Dorozhkin. The workshop will cover new advancements in high resolution visualization and quantitative studies of local