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Christmas scrolling text and mini game using a pic microcontroller and 8x8 led matrix
Press Release | www.instructables.com | Nov 19, 2009
I will be uploading a full instructable for this little kit within a day or two.www.bradsprojects.com for this and other...
http://www.instructables.com/id/Christmas-scrolling-text-and-mini-game-using-a-pic/
Modular Test Standard Builds On ATCA, PXI, LXI, And IVI
News | electronicdesign.com | Nov 19, 2009
Does the world really need another modular test standard? Ready or not, here comes AdvancedTCA Extensions for Instrumentation and Test (AXIe). Proposed by the trio of Aeroflex, Agilent Technologies, and Test Evolution Corp., AXIe is an open standard based on AdvancedTCA (ATCA) that aims to extend
Ten Asian Editors to Tour Verigy's Silicon Valley Operations (Business Wire)
News | finance.yahoo.com | Nov 17, 2009
CUPERTINO, Calif.--(BUSINESS WIRE)--On November 30, Verigy (NASDAQ:VRGY - News), a premier semiconductor test company, will host a visit to
http://finance.yahoo.com/news/Ten-Asian-Editors-to-Tour-bw-1909019414.html?x=0&.v=1
NXP unveils lifetime results for LED drivers
News | www.ledsmagazine.com | Nov 16, 2009
NXP is carrying out an accelerated lifetime test of its SSL2101 LED drivers, which have so far surpassed 7,000 hours with zero failures.
Test-and-Measurement/National-Instruments-Expands-PXI-Capabilities-for-Semiconductor-Test-With-New-Suite-of-Modular-Instruments
Press Release | www.electronicspecifier.com | Nov 14, 2009
National Instruments Expands PXI Capabilities for Semiconductor Test With New Suite of Modular Instruments : Electronics News from Electronic Specifier
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National Instruments Expands PXI Capabilities for Semiconductor Test With New Suite of Modular Instruments
Press Release | digital.ni.com | Nov 11, 2009
The NI PXI Semiconductor Suite incorporates ten new PXI products that expand the capabilities of PXI for mixed-signal semiconductor test.
http://digital.ni.com/worldwide/bwcontent.nsf/websearch/a76e66f2e92fe02486257657005c8e63
Brillia Introduces Thermadjust(TM), a Revolutionary Ambient Temperature-Sensing Technology for LED Modules
News | www.ledinside.com | Nov 11, 2009
LEDinside covers LED technology development, LED market trend, and financial information of the global and regional LED industry.
NXP Sets New Benchmarks for LED Drivers
News | flashlightnews.org | Nov 10, 2009
NXP Semiconductors today announced three major developments in its portfolio of mains connected LED driver solutions: the success of its SSL2101 LED driver IC in matching LED lifetimes in an accelerated lifetime test; the introduction of the SSL 2102 integrated dimmable mains LED driver IC for SSL
National Instruments Expands PXI Capabilities for Semiconductor Test With New Suite of Modular Instruments
Press Release | www.prnewswire.com | Nov 10, 2009
National Instruments Expands PXI Capabilities for Semiconductor Test With New Suite of Modular Instruments. Ten New DC, Digital, RF and Switching Products Deliver Increased Flexibility and Reduced Costs for Mixed-Signal Chip Test.
Three companies form AXIe test standard consortium
News | www.eetimes.com | Nov 10, 2009
Agilent Technologies, Aeroflex Inc., and Test Evolution Corp. have formed a consortium to promote a new standard: AdvancedTCA Extensions for Instrumentation and Test.
http://www.eetimes.com/rss/showArticle.jhtml?articleID=221601038&cid=RSSfeed_eetimes_newsRSS
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