Featured Suppliers:

Hardness | Adhesion | Wear/Friction
+ 3D Non-Contact Profilometry
Extensive In-House Testing To Meet
Military and Aerospace Standards.
Find Electronics Solutions
For Your Business. Get It Done Now!

Sponsored Links


 

Sponsored Links

MCC Testing/Measurement

Leader in Low Cost Data Acquisition Solutions. Save Time & Money Now!

www.mccdaq.com

IC Counterfeit Testing

Semiconductor IC validation and counterfeit testing services.

www.gd4testservices.com

 

Christmas scrolling text and mini game using a pic microcontroller and 8x8 led matrix

Press Release  |  www.instructables.com | Nov 19, 2009

I will be uploading a full instructable for this little kit within a day or two.www.bradsprojects.com for this and other...

http://www.instructables.com/id/Christmas-scrolling-text-and-mini-game-using-a-pic/

Modular Test Standard Builds On ATCA, PXI, LXI, And IVI

News  |  electronicdesign.com | Nov 19, 2009

Does the world really need another modular test standard? Ready or not, here comes AdvancedTCA Extensions for Instrumentation and Test (AXIe). Proposed by the trio of Aeroflex, Agilent Technologies, and Test Evolution Corp., AXIe is an open standard based on AdvancedTCA (ATCA) that aims to extend

http://electronicdesign.com/Articles/ArticleID/22180/22180.html?utm_source=feedburner&utm_medium=feed&utm_campaign=Feed%3A+EDMag+%28PlanetEE+-+Electronic+Design+Magazine%29

Ten Asian Editors to Tour Verigy's Silicon Valley Operations (Business Wire)

News  |  finance.yahoo.com | Nov 17, 2009

CUPERTINO, Calif.--(BUSINESS WIRE)--On November 30, Verigy (NASDAQ:VRGY - News), a premier semiconductor test company, will host a visit to

http://finance.yahoo.com/news/Ten-Asian-Editors-to-Tour-bw-1909019414.html?x=0&.v=1

NXP unveils lifetime results for LED drivers

News  |  www.ledsmagazine.com | Nov 16, 2009

NXP is carrying out an accelerated lifetime test of its SSL2101 LED drivers, which have so far surpassed 7,000 hours with zero failures.

http://www.ledsmagazine.com/news/6/11/18

Sponsored Links

JTAG Test and Programming

Easy to use tools for JTAG Testing and In-System Programming

www.corelis.com

Semiconductor Measurement

The Hardware & Software You Need for Accurate Metrology Solutions.

www.KLA-Tencor.com

 

National Instruments Expands PXI Capabilities for Semiconductor Test With New Suite of Modular Instruments

Press Release  |  digital.ni.com | Nov 11, 2009

The NI PXI Semiconductor Suite incorporates ten new PXI products that expand the capabilities of PXI for mixed-signal semiconductor test.

http://digital.ni.com/worldwide/bwcontent.nsf/websearch/a76e66f2e92fe02486257657005c8e63

Brillia Introduces Thermadjust(TM), a Revolutionary Ambient Temperature-Sensing Technology for LED Modules

News  |  www.ledinside.com | Nov 11, 2009

LEDinside covers LED technology development, LED market trend, and financial information of the global and regional LED industry.

http://www.ledinside.com/Brillia_20091111

NXP Sets New Benchmarks for LED Drivers

News  |  flashlightnews.org | Nov 10, 2009

NXP Semiconductors today announced three major developments in its portfolio of mains connected LED driver solutions: the success of its SSL2101 LED driver IC in matching LED lifetimes in an accelerated lifetime test; the introduction of the SSL 2102 integrated dimmable mains LED driver IC for SSL

http://flashlightnews.org/story2711.shtml

National Instruments Expands PXI Capabilities for Semiconductor Test With New Suite of Modular Instruments

Press Release  |  www.prnewswire.com | Nov 10, 2009

National Instruments Expands PXI Capabilities for Semiconductor Test With New Suite of Modular Instruments. Ten New DC, Digital, RF and Switching Products Deliver Increased Flexibility and Reduced Costs for Mixed-Signal Chip Test.

http://www.prnewswire.com/news-releases/national-instruments-expands-pxi-capabilities-for-semiconductor-test-with-new-suite-of-modular-instruments-69652632.html

Three companies form AXIe test standard consortium

News  |  www.eetimes.com | Nov 10, 2009

Agilent Technologies, Aeroflex Inc., and Test Evolution Corp. have formed a consortium to promote a new standard: AdvancedTCA Extensions for Instrumentation and Test.

http://www.eetimes.com/rss/showArticle.jhtml?articleID=221601038&cid=RSSfeed_eetimes_newsRSS

Sponsored Links

Contract Testing Services

Instruments for Surface Properties Characterisation & contract testing

www.csm-instruments.com

STDF Data Analysis Tools

IC Characterization, Wafer Maps Yield Management, Free Download

www.galaxysemi.com

Silicon Measurement

Precise Rapid Optical Gauging non-Contact and non-Destructive

www.lumetrics.com

 

Results 1-10 of 7,020

Refine by Content Type:

  • Refined by: News  

Refine by Source:

Choose a source :

Close

96 Sources ...

Refine by Company:

Choose a company :

Close

98 Companies ...