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Certification push for lte mobile devices

News  |  www.newelectronics.co.uk | Nov 20, 2009

Anritsu and Cetecom have joined forces in an effort to push for certification testing of new generation lte mobile devices.

http://www.newelectronics.co.uk/article/20838/Certification-push-for-lte-mobile-devices.aspx

Portable CCTV Test Monitors suit security camera installers.

News  |  news.thomasnet.com | Nov 19, 2009

November 19, 2009 - Portable CCTV test monitors include model MON-LCD4, with 4.2 in. screen offering 480 x 234 pixel resolution, and 1 BNC video input/1 BNC video output and audio in/out via RCA. It features rechargeable battery with power supply for charging.

http://news.thomasnet.com/fullstory/568943

Stress test at 85°C for electronics

News  |  www.evertiq.com | Nov 19, 2009

The latest demands of the automotive industry require the suppliers to take a functional test of PCBs and electronic assemblies with a duration of one hour at a temperature of 85°C. - Created: 2009-11-19 08:00, Source: evertiq, Category: Test & Measurement

http://www.evertiq.com/news/15552?utm_source=feedburner&utm_medium=feed&utm_campaign=Feed%3A+EvertiqCom%2FAll+%28evertiq.com+%3A%3A+Latest+news%29

Panasonic Selects National Instruments Products to Test Toughbook Laptop PCBs

Press Release  |  digital.ni.com | Nov 18, 2009

Panasonic engineers are using NI hardware and software products for the automated testing of new computer PCBs, including those in the new Toughbook rugged laptops.

http://digital.ni.com/worldwide/bwcontent.nsf/websearch/5694c871e61f479c86257654005c1c47

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Automated Assembly: Make or Buy?

News  |  www.assemblymag.com | Nov 18, 2009

Assembly, November 2009By John WirtzThe answer to the make or buy question typically depends on factors such as time constraints, the size and structure of the manufacturer and its engineering department, the assembly application and the type of machine. And, a decision to use a machine

http://www.assemblymag.com/Articles/Article_Rotation/BNP_GUID_9-5-2006_A_10000000000000690617

Panasonic Selects National Instruments Products to Test Toughbook Laptop PCBs

Press Release  |  www.prnewswire.com | Nov 17, 2009

Panasonic Selects National Instruments Products to Test Toughbook Laptop PCBs. NI PXI Modular Instruments, LabVIEW and NI TestStand Increase Automated Test Efficiency, Decrease Costs.

http://www.prnewswire.com/news-releases/panasonic-selects-national-instruments-products-to-test-toughbook-laptop-pcbs-70274982.html

Panasonic Selects National Instruments Products to Test Toughbook Laptop PCBs - Zibb.com

Press Release  |  www.zibb.com | Nov 17, 2009

National Instruments (Nasdaq: NATI) today announced that Panasonic engineers are using NI hardware and software products for the automated testing of new computer PCBs, including those in the new Toughbook( )rugged laptops. Panasonic has combined NI PXI modular hardware instrumentation with NI

http://www.zibb.com/article/5675015/Panasonic+Selects+National+Instruments+Products+to+Test+Toughbook+Laptop+PCBs

DATE 2010 takes off with a new record of more than 980 submissions

News  |  www.Embedded-Computing.com | Nov 16, 2009

‘This shows the worldwide leadership of DATE as a technical conference and exhibition. It is a clear sign that DATE 2010 in Dresden will be the place where all experts will meet and shape the future of our industry. Nobody can afford to miss this event.

http://www.Embedded-Computing.com/news/Conferences+and+Awards/19798?utm_source=feedburner&utm_medium=feed&utm_campaign=Feed%3A+dsp+%28DSP-FPGA+News%29

ASSET’s ScanWorks Supports PLX Technology’s PCI Express Switch Family’s visionPAK Diagnostic Toolset (Business Wire)

News  |  www.businesswire.com | Nov 14, 2009

RICHARDSON, Texas--(BUSINESS WIRE)--ASSET InterTech, the leading supplier of open tools for embedded instrumentation for design validation, test and debug, and PLX Technology, Inc. (NASDAQ: PLXT), the leading global supplier of PCI Express (PCIe) switch and bridge silicon, today

http://www.businesswire.com/portal/site/home/permalink/?ndmViewId=news_view&newsId=20091104005599&newsLang=en

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