Production Test & Measurement Industry News & Blogs

Industry News & Blogs

Agilent | Agilent Technologies to Demonstrate In-Circuit and Functional Test Solutions at IPC APEX
www.agilent.com | Feb 13, 2012
Agilent Technologies to Demonstrate In-Circuit and Functional Test Solutions at IPC APEX EXPO

Meet the pioneers of future and emerging technology
www.nanowerk.com | Feb 10, 2012
Meet the pioneers of future and emerging technology

Northgate-is - News Item 1169
www.northgate-is.com | Feb 10, 2012
< span > < font size= " 3 " > < font face= " Calibri " > Northgate Managed Services, < span > winner of < span > & nbsp; < /span > BETT 2012 & lsquo;ICT Company of the Year over & pound;3million turnover & rsquo; award < /span > , has further cemented its reputation as a leading provider of

Defence Minister opens TRaC’s test facility in Dorset
www.electronicsweekly.com | Feb 3, 2012
The test house plans to consolidate and expand its EMC and environmental test services at this single location

Cortex-M3 LPC1788 Header Board From CoiNel | PRLog
www.prlog.org | Feb 2, 2012
Cortex-M3 LPC1788 Header Board From CoiNel. The LPC1788 Header Board is based on Cortex M3 Core running at up to 120MHz,with512KB internal Flash memory and 96KB SRAM,4 KB EEPROM,LCD controller up to true color XGA,10/100 ethernet,USB 2.0 Host/Device/OTG,2 CAN,12-bit ADC,10-bit DAC,SD/MMC, I2S. -

Instrument Systems presents own current source for LEDs | LEDinside – LED, LED Lighting, LED Price
www.ledinside.com | Jan 30, 2012
New system solution for production tests with LEDs and LED wafers The LSM 350 4-quadrant source and measure unit from Instrument Systems was specifically developed to meet the requirements for production testing of LEDs and LED wafers. High test speeds and the multichannel capability make the LSM..

LEDs Magazine - LED Industry News: Gamma Scientific, Instrument Systems, Labsphere
www.ledsmagazine.com | Jan 26, 2012
Both Gamma Scientific and Instrument Systems have introduced low-cost CCD array spectrometers, Instrument Systems has introduced a production source and measure unit for use in production spectral light testing of LEDs and wafers, and Labsphere has appointed one of its long-time executives to head

Corelis Offers Integrated JTAG Solution with National Instruments | EMAsiaMag.com
www.emasiamag.com | Jan 26, 2012
Corelis Inc announced support for National Instruments High Speed Digital I/O (HSDIO) instruments with Corelis' ScanExpress suite of JTAG test and measurement tools. The marriage of National Instrumen

Altair Semiconductor Releases Production Test Tool Based on the Rohde &Schwarz CMW500, Optimized
www.altair-semi.com | Jan 16, 2012
Altair Semiconductor releases production test tool for 4G chipsets based on Rohde & amp; Schwarz CMW500.

GOEPEL electronic rocks Boundary Scan with BASS : Electronics News from ElectronicSpecifier
www.electronicspecifier.com | Jan 11, 2012
GOEPEL electronic rocks Boundary Scan with BASS : Electronics News from Electronic Specifier