Chip Inspection, Test & Measurement Press Releases

Press Releases

Keithley Publishes 2012 Test Measurement Product Catalog : Electronics News from ElectronicSpecifier
www.electronicspecifier.com | Feb 8, 2012
Keithley Publishes 2012 Test & Measurement Product Catalog : Electronics News from Electronic Specifier

3D TSV Test: ATE challenges and potential solutions
cdn.eetimes.com | Jan 27, 2012
3D TSV Test: ATE challenges and potential solutions

Frost & Sullivan: Futuristic Technologies to Drive Growth of Semiconductor ATE Market | PRLog
www.prlog.org | Oct 31, 2011
Frost & Sullivan: Futuristic Technologies to Drive Growth of Semiconductor ATE Market. Participants Must Step up the Tempo of Innovation to Ensure Business Progression - PR11711072

LDSBandwidth - The ChipList 2
www.chiplist.com | Sep 22, 2011
LDSBandwidth: Measures the peak bandwidth of local memory using different access patterns.

Carsem Receives Exar’s Supplier of the Year Award
www.prweb.com | Sep 14, 2011
Carsem, a leading provider of turnkey packaging and test services to the semiconductor industry, announced today that it has received Exar Corporation's FY2011 Supplier of The Year Award for assembly and test services that were provided by the Carsem factories located in Ipoh, Malaysia.

TERIDIAN UNVEILS INDUSTRY’S FIRST ENERGY MEASUREMENT CHIP FOR DATA CENTER POWER DISTRIBUTION UNITS
pdfserv.maxim-ic.com | May 15, 2011
Maxim offers Teridian energy-measurement SoC inside LED ballast.

STMicroelectronics
www.st.com | Feb 21, 2011
STMicroelectronics introduces metering chips for smart power meters.

Adding external memory to Atmega128 | Scientific, embedded, biomedical, electronics contents.
www.scienceprog.com | Dec 15, 2010
Atmega128 is equipped with internal 4Kbytes of SRAM memory. Is it enough? Well it depends on what project it’s gonna hold. If your project must deal with loads of data or run larger RTOS code you will definitely run out … <a

28-nm GlobalFoundries wafer spotted - The Tech Report
techreport.com | Jan 12, 2010
Last April, we reported that GlobalFoundries had begun development of a 28-nm high-k metal gate manufacturing process in collaboration with IBM, Chartered, Infineon, Samsung, and STMicro. Now, the folks at SemiAccurate have snapped a photo of a 28-nm GlobalFoundries wafer that appears to contain

EEbeat › Buddy, can you spare some pins?
www.eebeat.com | Jun 29, 2009
Click here Home | Feature Articles | New Products | News | Reference Designs | What's Inside | Energy Saving | Multimedia | Part Search Skip to content Home About Buddy, can you spare some pins? Maybe it’s because of my odd sense of humor, or that I like to