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Nordson’s X-Ray Inspection System Wins Award
Press Release | www.pcb007.com | Nov 12, 2009
Nordson DAGE is pleased to announce that it has been awarded a prestigious Global SMT Technology Award for the XD7600NT100 digital X-ray inspection system.
DALSA Introduces Next Generation Smart Camera for Single Point Machine Vision Inspection - Zibb.com
Press Release | www.zibb.com | Oct 1, 2009
DALSA Corporation (TSX: DSA), a global leader in machine vision technology, today announced the availability of the BOA vision system, a highly integrated smart camera that comprises all of the elements of an industrial machine vision system. Powerful and quick-to-deploy, the BOA is ideal for
High-resolution X-ray TDI camera
Press Release | www.edn.com | Sep 28, 2009
The C10650 X-ray TDI (time delay integration) camera conveniently fits under a conveyor to perform rapid X-ray inspections of objects on a production line, such as medicines, printed circuit boards, and surface-mounted components.
QImaging® Introduces EXi Aqua™ Microscopy Camera for Bio-Imaging
Press Release | www.prweb.com | Aug 24, 2009
PR: Multi-talented IEEE1394b Firewire lab workhorse delivers high resolution and sensitivity The EXi Aqua is an excellent entry- level ima
http://www.prweb.com/releases/microscopy/imaging/prweb2781484.htm
Frost & Sullivan Recognizes MIRTEC with the 2009 Award for Automated Optical Inspection Product Innovation of the Year
Press Release | www.frost.com | Jul 21, 2009
Based on its recent analysis of the automated optical inspection (AOI) equipment market, Frost & Sullivan recognizes MIRTEC with the 2009 Global Frost & Sullivan Award for Product Innovation of the Year for its innovative MV-7xi inline AOI system. This revolutionary AOI system combines high-speed
http://www.frost.com/prod/servlet/press-release.pag?Src=RSS&docid=174834806
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Synopsys Introduces Lower Power, High-Performance Architecture for AMBA 3 AXI On-Chip Interconnect
Press Release | news.prnewswire.com | Apr 15, 2009
This new architecture, available in synthesizable source RTL, allows designers to configure the bus fabric to eliminate unnecessary logic within the design, thereby reducing area, power consumption, and overall routing congestion.
http://news.prnewswire.com/ViewContent.aspx?ACCT=109&STORY=/www/story/04-15-2009/0005006303&EDATE=
X Tek Exhibit Computer Tomography at Productronica : Electronics News from ElectronicSpecifier
Press Release | www.electronicspecifier.com | Oct 22, 2007
X-Tek Exhibit Computer Tomography at Productronica : Electronics News from Electronic Specifier
Nitto Denko Jointly Develops High-precision Three-dimensional Electron Microscopy
Press Release | www.nitto.com | Dec 1, 2005
Nitto Denko Corporation Web site "Go to a bit of good future by seats and films : The company continuing to produce global niche top products including a liquid crystal optcial film"
Welcome to InspX
Press Release | www.inspx.com | Jun 12, 2004
• ScanTrac X-Ray Inspection Systems are created specifically for the food, beverage, and drug packaging industries.
Euresys Online - Press Release
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