Optical Media Products

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Corel Highlights High-Def BD Solutions
www.twice.com | Jan 8, 2007
Corel said the complete family of InterVideo and Ulead Blu-ray software will be featured at the company's exhibit space, South Hall 4, booth 35377, during International CES. The agreement for Corel to acquire InterVideo and its subsidiary, Ulead Systems, was announced last August.

CD-OTDR module
www.tmworld.com | Jun 1, 2004
Joining the CMA 5000 multi-layer test platform is the CMA 5300 CD-OTDR module, which employs the time-of-flight method as recommended by the TIA FOTP-168 to measure dispersion over a wide band from 1300 nm to 1625 nm. The CMA 5300 incorporates a series of applications, including CD, OTDR, loss test

CD-SEM
semiconductor.net | Oct 15, 2005
The Yosemite SP-1000 features high throughput (up to 1000 sites/hr) and clear imaging at the bottom of high-aspect-ratio contact holes (30:1). Like its predecessor, the measurement tool includes ultralow voltage and 3-D model-based critical shape metrology for 65 nm and below. Soluris Inc.,

CD Metrology Systems
semiconductor.net | Jun 15, 2002
Process Window Monitor (PWM) Series of CD metrology systems provides fully automated, Web-based CD process window monitoring and matching in real time for multiple lithography tools in high-volume manufacturing environments. Building on the company's CD-SEM and optical CD metrology tools, the

CD, Overlay Metrology Tool
semiconductor.net | Jun 15, 2007
The IVS 185 system is capable of making CD and overlay measurements using the same metrology recipe while achieving higher productivity. The ultrasmall footprint tool targets 50-200 mm wafer production requirements. It has 1800 hours MTBF. One unique characteristic is the multi-Z element that

CD SEM Software
semiconductor.net | Apr 1, 2000
The Pattern Quality Confirmation (pQC) software is designed to enhance the company's 8100 family of critical dimension scanning electron microscopes (CD SEMs). It combines in-line, real-time metrology with process inspection, enabling the detection of sch

CD Measurement System
semiconductor.net | Mar 15, 2007
The LWM9045 is a SEM-based mask metrology system for 45 nm. It uses a beam blanker to reduce charging, and the ozonizer enables low contamination rates. Measurement performance is increased by 30% percent, with long-term repeatability of better than 1 nm. Avoidance of local pattern matching and

Corel Highlights High-Def BD Solutions
www.twice.com | Jan 8, 2007
Corel said the complete family of InterVideo and Ulead Blu-ray software will be featured at the company's exhibit space, South Hall 4, booth 35377, during International CES. The agreement for Corel to acquire InterVideo and its subsidiary, Ulead Systems, was announced last August.

Coby Unveils Portable Media, MP3 Lineup
www.twice.com | Jan 8, 2007
Coby will unveil its latest portable media players, DVD, MP3 players and more at booth 14444 in the Central Hall. Coby's latest portable media players include the 20GB PMP4320 and the 30GB PMP4330 models which each feature 4.3-inch screens, SD memory card slots, A/V outputs for use with home