Products
STEC | DRAM | DDR3 Memory | DDR3 Technology, a New Outlook for Performance Driven System Designs
A Global Technology Leader of Award-Winning, Precision Engineered OEM SSD and Memory solutions. With 18 years of Experience STEC Empowers a full-range of OEM Applications with SSD, Flash, and DRAM solutions.
Products Overview
Products conformant to bus standards PMC cPCI VME M-Modules IP
DRAM Probe Card
The PH150XP is a wafer probe card designed for testing smaller-sized, smaller-density DRAM devices with four or more touchdowns per wafer. It has a MicroSpring contact design that accomodates >25,000 contacts. Architectural enhancements enable tighter planarity and higher positional accuracy, in
DRAM Metrology System
MetaPULSE IIIa is a thin-film metrology tool designed for film thickness measurements in aluminum-based DRAM manufacturing processes. PULSE technology provides high-volume, on-product thickness and material characterization for metal films over a broad range of types, dimensions and multilayered
V6000 tests both flash and DRAM
Verigy has announced the V6000 for testing both flash and DRAM memory on the same automated test equipment platform. The V6000 family of testers includes the V6000e, which supports memory test-program development and device characterization in the office or lab environment; the V6000 WS, which
Hynix Semiconductor Licenses ISis Z RAM Memory Technology for DRAM Products : Electronics News from
Hynix Semiconductor Licenses ISi s Z-RAM Memory Technology for DRAM Products : Electronics News from Electronic Specifier
STEC | DRAM | DDR3 Memory | DDR3 Technology, a New Outlook for Performance Driven System Designs
A Global Technology Leader of Award-Winning, Precision Engineered OEM SSD and Memory solutions. With 18 years of Experience STEC Empowers a full-range of OEM Applications with SSD, Flash, and DRAM solutions.
STEC | DRAM | SDRAM | Sophisticated Features that make Standard Dynamic RAM Considerably Faster
A Global Technology Leader of Award-Winning, Precision Engineered OEM SSD and Memory solutions. With 18 years of Experience STEC Empowers a full-range of OEM Applications with SSD, Flash, and DRAM solutions.
Flash and DRAM Test System
T5375 memory test system provides high-throughput testing for 300 mm front-end DRAMs and high-speed back-end flash memories. It can test up to 128 devices simultaneously at speeds of 143 MHz or 286 MHz DDR. This system can be used for front-end testing
STEC | DRAM | DDR2 Memory | Enhancement of DDR with Improvements to Transfer Data and Speed
A Global Technology Leader of Award-Winning, Precision Engineered OEM SSD and Memory solutions. With 18 years of Experience STEC Empowers a full-range of OEM Applications with SSD, Flash, and DRAM solutions.
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