Other ICs Products

Products

SOC Test System
semiconductor.net | Jul 18, 2001
T6673 SOC test system is designed to provide maximum production throughput, reliability and economy. It can serve as a high-volume production partner to the T6683. It provides up to 500 MHz performance. Its mixed signal/analog instruments, high-speed cl

SOC Test System
semiconductor.net | Dec 1, 1999
The HP 93000 SOC Series Model C400 is a production test system for system-on-a-chip (SOC) devices. The unit provides data rates up to 400 Mbits/sec and overall timing accuracy of ±350 psec. It includes integrated high-performance analog instrumentati

SOC Mask Verification System
semiconductor.net | Mar 1, 2001
Venus physical and mask verification system is designed to address the future design requirements of 100 million-gate mixed-signal SOC designs at 0.1 µm and beyond. It can be used for the most aggressive ultra-deep submicron (UDSM) designs. It uses hie

SOC Testing Module
semiconductor.net | Oct 15, 2005
The 6.5GDM digital module for the company's T2000 open-architecture test platform was designed to enable low-cost, flexible testing of SoCs incorporating advanced serializer/deserializer (Ser/Des) communications interfaces. It can accommodate SoCs employing a variety of SerDes standards and

SOC Test System
semiconductor.net | Feb 1, 2000
The HP 93000 SOC Series Model C400 is a production test system for system-on-a-chip (SOC) devices. The unit provides data rates up to 400 Mbits/sec and overall timing accuracy of ±350 psec. It includes integrated high-performance analog instrumentation. S

SOC Diagnostic Tool
semiconductor.net | Jun 1, 2000
The IDS P3Xa, a design diagnostic and modification tool, provides precision and micro-probe manipulation in characterizing system-on-chip (SOC) and datacom devices. The unit uses FIB (focused ion beam) microscopy and mechanical microprobes to reduce diagn

NanoKTN Helps UK Nanomaterials Company Secure Global Interest for Products : Electronics News from
www.electronicspecifier.com | Nov 22, 2010
NanoKTN Helps UK Nanomaterials Company Secure Global Interest for Products : Electronics News from Electronic Specifier

SOC DFT Tester
semiconductor.net | Sep 15, 2003
93000 DFT series addresses high-volume system-on-chip (SOC) development flow so that devices designed with advanced DFT realize significant test savings. System consists of analog blocks, memory, third party cores as well as proprietary cores and glue logic. Test techniques range from at-speed

SOC Text System
semiconductor.net | Jul 2, 2000
The EXA3000 series test system is designed to test complex 0.18 µm SOC devices. The system fully integrates the highest accuracy with high throughput, multi-site test on digital and analog pins. Features include a single platform, scalable Sequencer Per

SOC Test Handler
semiconductor.net | Feb 1, 2002
M4541AD dynamic test handler is for system-on-a-chip (SoC) and other high-end logic devices. This system can test up to eight devices simultaneously with a maximum throughput of 6000 devices/hr. It can be used with memory test systems and features a device-handling mechanism that optimizes the