Products
Signal-conditioner IC
The ZMD31150 high-speed automotive signal-conditioner IC provides advanced on-chip diagnostics and can be used with all types of Wheatstone bridge sensors. ZMD says that the ZMD31150 can handle all sensing applications in automotive environments, such as fuel injection, ABS, power steering, air
Deep-memory scopes
Agilent expands its Infiniium line of oscilloscopes with four digital storage and mixed-signal models, two each at 600-MHz and 1-GHz bandwidths. All of the scopes come with four analog channels, while two models add 16 logic inputs for debugging mixed-signal systems. Each instrument samples at 4
Event data recorder integrates F-RAM memory
Ramtron International, a developer of nonvolatile ferroelectric random-access memory (F-RAM) and integrated semiconductor products, has launched the FM6124 F-RAM-based event data recorder (EDR). The FM6124 continuously monitors state changes and stores them in the F-RAM. It is designed for use in
Camera includes Intel Celeron processor
Members of the Matrox Iris P-Series line of programmable smart cameras each combine sensor, processing, and software technologies in one package. Designed for PC-based machine-vision systems, each camera features a software API (application programming interface) for image analysis. The Iris
Cadence links IC design and manufacturing
Cadence links IC design and manufacturing -- Test & Measurement World, 11/2/2003 2:00:00 AM Cadence Design Systems has unveiled its Encounter Test Solutions suite of test tools to support a unified test methodology bridging design and manufacturing. Encounter Test Solutions helps design and test
Product Update
Product Update By Staff -- Test & Measurement World, 9/1/2002 2:00:00 AM Meter includes serial port The 4-1/2-digit Model 380193 LCR meter provides standard ranges for measurement of inductance (2000 µH to 10 kH), capacitance (2000 pF to 10 mF), and resistance (20 Ω to 10 MΩ). The meter also
Product Update
Product Update Staff -- Test & Measurement World, 10/1/2001 2:00:00 AM DFT product cuts ATE scan-memory requirements Mentor Graphics' TestKompress product, the first member of the company's Embedded Deterministic Test family, employs compression technology that allows semiconductor manufacturers to
SRG Recent Report Finds MediaTek WiMAX SoC Outperformed Its Peer Products : Electronics News from
SRG Recent Report Finds MediaTek WiMAX SoC Outperformed Its Peer Products : Electronics News from Electronic Specifier
Wafer Inspection System
The WS-3800 Xpress is a wafer inspection system that performs macro defect inspection reaching 115 wph. It has an optional 3-D inspection module that accommodates automatic inspection of flip-chip wafers at any step in the manufacturing process. The system uses high-speed time-delay integration
Analytical SEM
The JSM-7001F is a thermal field emission (FE) analytical SEM that acquires high-resolution micrographs at up to 1,000,000×. It features a lens FE gun that delivers >200 nA of beam current to the sample. An extremely small probe diameter at low kV and high current is optimal for the
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