ATE Products

Products

Product Update
www.tmworld.com | Oct 1, 2001
Product Update Staff -- Test & Measurement World, 10/1/2001 2:00:00 AM DFT product cuts ATE scan-memory requirements Mentor Graphics' TestKompress product, the first member of the company's Embedded Deterministic Test family, employs compression technology that allows semiconductor manufacturers to

ATE Probers
semiconductor.net | Sep 15, 2004
A new robotic prober for the high-end semiconductor test industry solves one of the critical calibration problems facing high-end automatic test equipment manufacturers. The company's family of robots has been expanded to include R-Theta and X-Y versions for many ATE testers. The robots attach

Aeroflex enters US ATE market
www.tmworld.com | Dec 1, 2006
Aeroflex has introduced its 5800 series of configurable ATE systems into the US. Launched in Europe in 2005, the 5800 series provides board and system functional tests of avionics, automotive, military, and medical products. Available in bench, floor-standing, or rack-mount configurations, the

Timing Analyzer
semiconductor.net | Sep 15, 2004
The Femto 2000 precision timing analyzer and the AMX 270 Active MUX are designed to extend ATE equipment life, particularly for those testing very low ASP microcontroller and consumer devices incorporating high-speed PLLs, spread spectrum clocks and analog signals that are very difficult to test on

SoC ATE
semiconductor.net | Oct 1, 2003
Sapphire NP ATE supports capabilities needed for of system-on-chip (SoC) test demands from design to production. It uses the NPower architecture, providing a small-footprint system with self-encapsulated instruments designed for specific test applications. Its NPower Isochronous Fabric Interface

Automated Test Equipment
semiconductor.net | Sep 15, 2004
The T2000 MicroStar (MS) is a streamlined, small-footprint mainframe tester based on the Semiconductor Test Consortium's Openstar open-architecture test standard, developed to provide a degree of test flexibility and system interoperability. It is designed to test microcontrollers, low-end

DC/DC converters for ATE
www.tmworld.com | Nov 1, 2005
Vicor's "E grade" line of second-generation DC/DC converter modules and VIPAC arrays (which operate from –10°C to +100°C) cost approximately 15% less than "C grade" versions (which operate from –20°C to +100°C). Targeting ATE, communications, defense, and aerospace applications, the converters are

ATE System
semiconductor.net | Jun 16, 2001
This ATE system provides complete in-circuit and functional test capabilities. Test applications include in-circuit, functional and telecom. Features include applications wizards speed software, rapid expansion capabilities such as GPID and rapid ROI.

Scalable pattern-conversion software
www.tmworld.com | Jun 1, 2007
Test Systems Strategies Inc. (TSSI) has announced two pattern-conversion software products, TD-Scan and TD-Sim. Both products can be configured to support all popular ATE platforms, performing tester rule checking for each ATE model before generating ready-to-load ATE files. TD-Scan supports ATPG

Vicor introduces 320-W regulator
www.tmworld.com | Mar 1, 2007
Vicor has introduced a high-power-density (greater than 1100 W/in3) 320-W PRM (pre-regulator module) non-isolated regulator. Designated P045F048T32AL, this latest component in the vendor’s VI Chip family is designed for 48-V power applications involving automated test equipment, servers, and