SoC ATE

News  |  www.semiconductor.net | Oct 1, 2003

Sapphire NP ATE supports capabilities needed for of system-on-chip (SoC) test demands from design to production. It uses the NPower architecture, providing a small-footprint system with self-encapsulated instruments designed for specific test applications. Its NPower Isochronous Fabric Interface

http://www.semiconductor.net/article/199155-SoC_ATE.php?rssid=20279

SPEA to Integrate FlashRunner into its ATEs

Press Release  |  www.edn.com | Apr 27, 2009

SPEA and SMH Technologies announce today that they have signed an agreement to develop a dedicate kit which will make it possibile to easily integrate FlashRunner technology into SPEA systems.

http://www.edn.com/pressRelease/2140360560.html?nid=3375

Welcome to Chroma ATE Inc. | Products > Semiconductor/IC Testing > VLSI Test System > Model 3520

Semiconductor/IC Testing > VLSI Test System > Model 3520 LCD Driver IC Test System">

http://www.chromaate.nl/product/detail.aspx?gid=650&id=1640

ATE Test System

News  |  www.semiconductor.net | Jun 16, 2001

Femto 3200 provides an accurate production timing test solution for high-speed and timing-sensitive devices with its 32-channel, 3.2Gbps patented precision time interval analyzer (TIA) technology for production ATE. It enables picoseconds timing measur

http://www.semiconductor.net/article/201943-ATE_Test_System.php

ATE Test System

News  |  www.semiconductor.net | Jun 16, 2001

Femto 3200 provides an accurate production timing test solution for high-speed and timing-sensitive devices with its 32-channel, 3.2Gbps patented precision time interval analyzer (TIA) technology for production ATE. It enables picoseconds timing measur

http://www.semiconductor.net/article/201943-ATE_Test_System.php?rssid=20279

Welcome to Chroma ATE Inc. | Products > Power Supply Testing > Instruments and Systems for

Power Supply Testing > Instruments and Systems for Electromagnetic Field Testing > Model Combinova MFM 3000 Magnetic Field Meter">

http://www.chromaate.nl/product/detail.aspx?gid=619&id=1580

ATE System

News  |  www.semiconductor.net | Jun 16, 2001

This ATE system provides complete in-circuit and functional test capabilities. Test applications include in-circuit, functional and telecom. Features include applications wizards speed software, rapid expansion capabilities such as GPID and rapid ROI.

http://www.semiconductor.net/article/206345-ATE_System.php

ATE Probers

News  |  www.semiconductor.net | Sep 15, 2004

A new robotic prober for the high-end semiconductor test industry solves one of the critical calibration problems facing high-end automatic test equipment manufacturers. The company's family of robots has been expanded to include R-Theta and X-Y versions for many ATE testers. The robots attach

http://www.semiconductor.net/article/201541-ATE_Probers.php?rssid=20279

Welcome to Chroma ATE Inc. | Products > Automated Optical Inspection > Model 7500 series

Automated Optical Inspection > Model 7500 series Sub-Nanometer 3D Optical Profiler">

http://www.chromaate.nl/product/detail.aspx?gid=600&id=1586

Timing Analyzer

News  |  www.semiconductor.net | Sep 15, 2004

The Femto 2000 precision timing analyzer and the AMX 270 Active MUX are designed to extend ATE equipment life, particularly for those testing very low ASP microcontroller and consumer devices incorporating high-speed PLLs, spread spectrum clocks and analog signals that are very difficult to test on

http://www.semiconductor.net/article/205328-Timing_Analyzer.php