Products
Test.Lab adds vibration-control tests
LMS has introduced a new Test.Lab Vibration Control package, which provides a four- to eight-channel system for closed-loop vibration control testing. Using the system, test engineers can determine whether a product is fit for normal to extreme operating conditions and whether it can survive rough
NI VeriStand 2009 serves test and simulation applications
National Instruments at NIWeek 2009 (August 4–6, Austin, TX) announced NI VeriStand 2009, an open, configuration-based software environment for creating real-time testing applications such as hardware-in-the-loop and controlled environmental tests. VeriStand implements the common functionalities of
System tests automotive emissions
The AES 5500 EMC transient emissions test system from Teseq lets you test automotive systems for conducted electrical transients.
PXI modules perform ARINC 608A switching
Expanding its line of products for the aerospace market, Pickering Interfaces has introduced two PXI switching modules that route signals in avionics test systems. The modules can be used in any 3U PXI chassis as well as in Pickering’s LXI modular switching chassis. The 40-569 module comes as a
Product Update
Product Update By Staff -- Test & Measurement World, 9/1/2002 2:00:00 AM Meter includes serial port The 4-1/2-digit Model 380193 LCR meter provides standard ranges for measurement of inductance (2000 µH to 10 kH), capacitance (2000 pF to 10 mF), and resistance (20 Ω to 10 MΩ). The meter also
Product Update
Product Update Staff -- Test & Measurement World, 10/1/2001 2:00:00 AM DFT product cuts ATE scan-memory requirements Mentor Graphics' TestKompress product, the first member of the company's Embedded Deterministic Test family, employs compression technology that allows semiconductor manufacturers to
IC Test Transfer System
The HT 2700 BINNER is a production qualified binner and media transfer system for high-volume, production test environments. The unit can sort over 10,000 devices/hr. Features include a 50 JEDEC tray input, nine sort categories, user friendly interface an
IC Test System
Integra FLEX high-volume, high-mix IC test system combines universal slot architecture with self-contained SOC Tester Per Pin instruments to provide the freedom to match test capacity to device coverage needs. Independent Time Tracks per instrument and background DSP processing boost efficiency,
Probe Card Analyzer
PrecisionPoint VX3 probe card analyzer can reduce probe card test times by up to 50%. The analyzer offers expanded applications from the VX2 system for manufacturing, testing and reworking of the most advanced probe card technologies including multi-DUT, radius, cobra, cantilever, vertical,
300 mm Parametric Test System
The 4073A parametric test system provides accurate evaluation of ultralow current and voltage on 300 mm wafers. Features include SECS/GEM interface link to all automation, ultra-low noise floor, measurement precision and resolution, and fast low-current
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