PXI modules perform ARINC 608A switching

News  |  www.tmworld.com | Apr 1, 2008

Expanding its line of products for the aerospace market, Pickering Interfaces has introduced two PXI switching modules that route signals in avionics test systems. The modules can be used in any 3U PXI chassis as well as in Pickering’s LXI modular switching chassis. The 40-569 module comes as a

http://www.tmworld.com/article/318729-PXI_modules_perform_ARINC_608A_switching.php?rssid=20475

Protocol tester supports wideband AMR

News  |  www.tmworld.com | Feb 1, 2008

The 6113 Air Interface Monitor Emulation (AIME) base station protocol test system from Aeroflex now offers wideband adaptive multi-rate (AMR) support, which is related to the 3GPP TS45.003 test specification. By combining the 6113E test set with the 6113E AIME software package, you can monitor,

http://www.tmworld.com/article/320651-Protocol_tester_supports_wideband_AMR.php?rssid=20431

ispClock5600A

The ispClock5610A and ispClock5620A are in-system-programmable high-fanout enhanced zero delay clock generators designed for use in high performance communications and computing applications.

http://www.i2p.com/products/ispclock/ispclock5600a.cfm

Products -- September 15, 2002: Fault Test System

News  |  www.semiconductor.net | Sep 15, 2002

Fault Manager test suite can reduce fault simulation time and expose untested areas prior to fault simulation. It analyzes test vectors in conjunction with the design structure. The system also provides concurrent, open access to test data. Available in Linux and Solaris platforms. Provis Corp.

http://www.semiconductor.net/article/207902-Products_September_15_2002_Fault_Test_System.php

Test system supports all A-GPS test cases

News  |  www.tmworld.com | Jun 1, 2008

Spirent Communications announces that its UMTS Location Test System (ULTS) now offers full certification testing of the 3rd Generation Partnership Project’s (3GPP’s) Assisted GPS (A-GPS) RF Minimum Performance test cases for both W-CDMA and GSM devices. Spirent claims it is the first test-equipment

http://www.tmworld.com/article/317744-Test_system_supports_all_A_GPS_test_cases.php?rssid=20431

Radio Communication Analyzer MT8815A - Anritsu

T8815A is the fastest and most accurate mobile phone tester for repair applications, and the only tester that supports all popular 2G, 2.5G, and 3G technologies in one unit, including a scalable platform providing investment protection by allowing installation of new wireless formats.

http://www.anritsu.de/products/default.php?p=199&model=mt8815a

Flash and DRAM Test System

News  |  www.semiconductor.net | Jul 18, 2001

T5375 memory test system provides high-throughput testing for 300 mm front-end DRAMs and high-speed back-end flash memories. It can test up to 128 devices simultaneously at speeds of 143 MHz or 286 MHz DDR. This system can be used for front-end testing

http://www.semiconductor.net/article/204653-Flash_and_DRAM_Test_System.php

Hot swap your PCI Express boards

News  |  www.tmworld.com | May 1, 2008

The PCIeExt16HOT PCI Express (PCIe) live-insertion bus extender board lets you test and debug PCIe boards without powering down your computer. It installs into any PCIe x16 motherboard slot and is compatible with x1, x4, x8, and x16 boards. The extender board has current-sensing shunt resistors and

http://www.tmworld.com/article/319440-Hot_swap_your_PCI_Express_boards.php?rssid=20431

Digital Mobile Radio Transmitter Tester MS8604A - Anritsu

S8604A offers full test performance in a single unit capable of evaluating the major characteristics of transmitters used in digital mobile communication worldwide. Applicable systems are PDC, PHS, NADC, digital MCA, GSM, DCS1800 (PCN), CT2, DECT, WCPE, PACS, RCR STD-39 and TETRA.

http://www.anritsu.de/products/default.php?p=214&model=ms8604a

High-Volume SOC Test System

News  |  www.semiconductor.net | Dec 1, 1999

The T6672 VLSI test system for high-volume production testing is designed for ASIC or system-on-a-chip (SOC) devices that require test of embedded memory, large SCAN patterns or mixed-signal features. The system can be used to provide wafer probe of Rambu

http://www.semiconductor.net/article/207396-High_Volume_SOC_Test_System.php