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Cadence links IC design and manufacturing
Cadence links IC design and manufacturing -- Test & Measurement World, 11/2/2003 2:00:00 AM Cadence Design Systems has unveiled its Encounter Test Solutions suite of test tools to support a unified test methodology bridging design and manufacturing. Encounter Test Solutions helps design and test
Product update
Product update Staff -- Test & Measurement World, 4/1/2003 2:00:00 AM EDITORS' CHOICE Socket system supports high-speed BGA test Emulation Technology's new Ball Grid Array (BGA) Socket and Probing System ensures complete signal access between the target printed circuit board and the IC package
Event-Based IC Tester
CertiMAX design validation test system is for testing complicated ICs in the manufacturing test environment. The event-based technology is integrated into the Semiconductor Test Consortium’s open-architecture platform. The system simplifies the process of functional validation, debug...
IC Validation System
CertiMAX design validation system tests highly intricate ICs and speeds up SoC validation and debugging through virtual elimination of the design-to-test gap. Design data is used directly on the tester without requiring vector or timing translation, and the system simplifies the test process by
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Test-system components
1998 Test System and VXI Products Catalog contains a selection of test-system components, and VXI products and services that help reduce the cost of building test systems. Product descriptions and summary specifications are provided. Hewlett-Packard Co.
Software Links Design/Prototyping to Shorten Development Cycles
There is a number of tools that streamline a product's design cycle, and many instruments make it possible to measure the performance of that product's prototypes. National Instruments has unveiled software that links these two environments, making it simpler to integrate design software parameters
PCIe 3.0 tools tackle design, test, debug
Tektronix has released a suite of test products for PCIe (PCI Express) 3.0, spanning protocol to physical analysis in a single platform.
BIST Software
Fiesta CMBT memory BIST (built-in self-test) software tool provides full-speed and fault-accumulative testing of system-on-a-chip (SoC) devices with repairable embedded memories. It enables real-time testing and generates repair fuse maps for embedded memories. It addresses full-speed testing and
Field meter adds digital memory
The Smart Fieldmeter Digital from EMC Test Design measures electric fields from 200 kHz to 18 GHz, depending on which attachable probe you use. The Digital version adds support for an SD memory card, which lets you store data for downloading into a PC. A 1-Gbyte card can store up to 100,000
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