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Failure Analysis Software
News | www.semiconductor.net | Feb 1, 2001
The image|optimiser 3.1 fully integrated inspection and analysis software program is for real-time failure analysis and inspection. The program can be used for inspection and verification of boards using BGAs, flip-chips, mBGAs and other high-density p
http://www.semiconductor.net/article/203652-Failure_Analysis_Software.php?rssid=20279
Magma Announces BoardView: Extends Chip-Based Navigation to Circuit- and Board-Level Debug
Press Release | www.edn.com | Nov 16, 2009
Magma(R) Design Automation (Nasdaq:LAVA - News), a provider of chip design software, today announced BoardView(TM), a new software that extends CAD navigation and circuit debug from integrated circuits (ICs) to printed circuit boards (PCBs) and multichip modules (MCMs).
CRM - Software Testing Techniques
Reliability and continuous availability have become crucial for computer software in the information economy. Well-publicized failures from both industry and government have underscored the need for mission-critical software to be thoroughly tested before being released into the marketplace.
http://www.charlesriver.com/books/BookDetail.aspx?productID=91542
Failure Analysis Software
News | www.semiconductor.net | Apr 2, 2001
ESCOSY Plus-CAD Navigation is a PC-based navigation software for failure analysis. It runs on analytical tools like SEMs, AFMs, FIBs, PEMs, SIMS, dual-beam systems or optical microscopes, and navigate to fail positions on wafers and in single dies. Feat
http://www.semiconductor.net/article/207551-Failure_Analysis_Software.php
Magma Announces BoardView: Extends Chip-Based Navigation to Circuit- and Board-Level Debug
Press Release | www.edn.com | Nov 16, 2009
Magma(R) Design Automation (Nasdaq:LAVA - News), a provider of chip design software, today announced BoardView(TM), a new software that extends CAD navigation and circuit debug from integrated circuits (ICs) to printed circuit boards (PCBs) and multichip modules (MCMs).
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Evans Analytical Group
Experts in High Resolution TEM including EDX, EELS and FIB prep
EFX Interconnects 2ch - 4ch Metallic Twisted Pair 4Ch Twisted Silver RCA 6ft at Scosche.com
TW4Four Channel Metallic Silver Twisted Pair Pre-Cut Interconnect CableConstructed with the same insane quality as A-TWD except 4-channel. Each interconnect is terminated with Iced Platinum barrels. Patented.
http://www.scosche.com/products/sfID1/160/sfID2/266/sfID3/257/productID/710
BGA Failure Analysis System
News | www.semiconductor.net | Nov 1, 2000
NXR-130 ultra-high-resolution failure analysis system provides real-time images for failure analysis of BGA, µBGA and flip-chip components. With 230× magnification capability, an 8 µm focal spot and X-ray source to 120 kV, the system can inspect t
http://www.semiconductor.net/article/200592-BGA_Failure_Analysis_System.php
OneSpin’s new debug automation technology boosts
Press Release | www.edn.com | Jul 15, 2009
An integral part of OneSpin’s 360 MV solution, the RootCauseAnalyzer provides the most advanced debug automation capabilities available in formal ABV tools today.
LML Products Details
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http://www.linuxmedia.com/product_details.php?prodid=336&PHPSESSID=20f174737985cbc1c9b842ad5bab8628
Optical Microscopes in Netherlands
Product | www.zibbsearch.nl | Oct 7, 2007
Optical Microscopes - Netherlands ǂ Advertentie
http://www.zibbsearch.nl/elektronica/suppliers/optical+microscopes/nl/25751575
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