Inspection Products

Products

Agilent launches 3-D in-line AXI system
www.tmworld.com | May 1, 2007
Agilent Technologies has announced what it calls the world’s fastest in-line automated 3-D x-ray inspection system that can detect printed-circuit-board assembly (PCBA) solder and manufacturing-assembly defects. Called the Agilent Medalist x6000 AXI, the new system more than doubles the throughput

Microscopy Standard Reference
semiconductor.net | Sep 1, 1999
MRS-4 is an ISO-9000 and ISO Guide-25 standard for critical dimension measurements. This traceable magnification reference standard is for all types of microscopy such as SEM, optical, confocal, STM and AFM. Usable from 10X to 200000X with pitch patterns

X-Ray and Vision PCB Inspection System
semiconductor.net | Jan 1, 1999
The XRV system is an automated, in-line combination X-ray and vision PCB system, capable of checking every PCB feature completely. It will identify correct part orientation and positioning and inspect all BGA, flip-chip, and other hidden solder joints. It

Machine Vision & Inspection: 2009 Buyer's Guide
www.tmworld.com | Jul 1, 2009
Use our updated buyer's guide to find the products you need.

X-Ray Inspection
semiconductor.net | Mar 15, 2006
Model 1550 is a fully automated X-ray inspection system designed specifically for the manufacturing floor. It features a large-board X-ray inspection with automated motion control, measurement and analysis. Also included is advanced solid-state detector-based inspection for lead-free assembly and

Component Inspection Systems
semiconductor.net | Dec 1, 2000
The I-2000 family of automated inspection machines uses advanced machine vision to dimensionally inspect production parts to print specifications. The first model to be introduced inspects fasteners and formed parts and can be adapted to inspect electr

Microscopy Software
semiconductor.net | Jun 1, 2002
AxioVision Version 3.1 image recording and archiving software supports the export of the JPEG 2000 image format and permits creation of animated sequences of time series of Z-stacks (AVI). It provides a new function for the batch conversion of ZVI images into standard image formats. A foot switch

Microscopy Focus Device
semiconductor.net | Apr 1, 2003
P-721.CLQ PIFOC Nano-Focus device is for applications such as scanning microscopy, cell tracking and surface profiling. Offering sub-nanometer resolution and stability, the unit can be mounted between the turret and objective of any microscope for fast, accurate focus control. Equipped with

Inspection X-ray System
semiconductor.net | Apr 1, 2001
The 100 kV pcba|inspector high-resolution microfocus X-ray system is designed for the inspection of printed circuit-board assemblies to detect manufacturing errors such as ball grid array (BGA) missing balls, voiding and shorts. It provides total-qualit

X-Ray Inspection System
semiconductor.net | Feb 1, 2002
VJ-1000 LP high-resolution X-ray inspection system provides high-resolution images of BGAs, µBGAs and other chip-scale packages with a 4 in. image intensifier, digital X-ray control and 25-200× magnification for precise inspection. It can accommodate PCBs up to 18 × 27 in.