X-ray inspection system available in two configurations

News  |  www.tmworld.com | Feb 1, 2008

The Verifier H series of horizontal-beam x-ray inspection systems from FocalSpot is designed for industrial, automotive, and medical applications. The systems provide manufacturing quality assessment and defect detection of components such as automotive sensors, electronic modules, and medical

http://www.tmworld.com/article/324445-X_ray_inspection_system_available_in_two_configurations.php?rssid=20431

AXI system offers programmable angle-shot capability

News  |  www.tmworld.com | Dec 21, 2007

MatriX Technologies has expanded its automated x-ray inspection (AXI) line-up with the addition of the X2.5. The X2.5 features a programmable angle-shot capability and is suitable for high-throughput automatic solder-joint inspection of double-sided PCBs. The company says that the angle-shot

http://www.tmworld.com/article/320092-AXI_system_offers_programmable_angle_shot_capability.php?rssid=20431

Product Index

SMART Group Showing 19 to 20 of 20 products in this category. | Previous | Next | Choose another category | Introduction to X-Ray Inspection of BGA and Fine Pitch Joints Introduction to X-Ray Inspection of BGA and Fine Pitch Joints Duration: 35 minutes Criteria for: component placement BGA joints

http://www.smartgroup.org/products/productlist.asp?CatID=5&offset=18

Inspection X-ray System

News  |  www.semiconductor.net | Mar 1, 2001

The 100 kV pcba|inspector high-resolution microfocus X-ray system is designed for the inspection of printed circuit-board assemblies (PCBA) to detect manufacturing errors such as ball grid arrays (BGA) missing balls, voiding and shorts. It provides tota

http://www.semiconductor.net/article/196425-Inspection_X_ray_System.php

Smart Camera Simplifies Automated Inspection

News  |  www.designnews.com | Sep 22, 2008

By placing image processing capabilities directly on a camera sensor, National Instruments has created an automated inspection camera that's simpler and less costly.

http://www.designnews.com/article/48192-Smart_Camera_Simplifies_Automated_Inspection.php

Welcome to Chroma ATE Inc. | Products > Automated Optical Inspection > Model 7500 series

Automated Optical Inspection > Model 7500 series Sub-Nanometer 3D Optical Profiler">

http://www.chromaate.nl/product/detail.aspx?gid=600&id=1586

Microscopy Standard Reference

News  |  www.semiconductor.net | Sep 1, 1999

MRS-4 is an ISO-9000 and ISO Guide-25 standard for critical dimension measurements. This traceable magnification reference standard is for all types of microscopy such as SEM, optical, confocal, STM and AFM. Usable from 10X to 200000X with pitch patterns

http://www.semiconductor.net/article/209345-Microscopy_Standard_Reference.php

S/TEM Microscopy

News  |  www.semiconductor.net | Mar 15, 2008

TEAM (transmission electron aberration-corrected microscopy) makes it possible to study how atoms combine to form materials, how materials grow, and how they respond to a variety of external factors. This microscope uses both TEM and S/TEM to directly view basic building blocks of matter. It

http://www.semiconductor.net/article/203856-S_TEM_Microscopy.php?rssid=20279

Micromanipulator Company, Probing Equipment

The Micromanipulator FA-2000 Portable Emission Microscopy systems, with their unique design, can be configured as a stand alone bench-top unit, be integrated to probe stations, or placed directly on a test head for package and wafer level analysis.

http://www.micromanipulator.com/products/product.php?item=201&cat=18

X-Ray Inspection System

News  |  www.semiconductor.net | Aug 1, 2001

F.O.X. X-ray inspection system is for conducting real-time inspection of BGA, µBGA, chip-scale package, flip chip, chip-on-board, bond wires, wedge bond, vias and other applications where precise measurement is needed. It combines high-resolution X-ray

http://www.semiconductor.net/article/208116-X_Ray_Inspection_System.php