Semiconductor Testing Products

Products

Product update
www.tmworld.com | Apr 1, 2003
Product update Staff -- Test & Measurement World, 4/1/2003 2:00:00 AM EDITORS' CHOICE Socket system supports high-speed BGA test Emulation Technology's new Ball Grid Array (BGA) Socket and Probing System ensures complete signal access between the target printed circuit board and the IC package

Product Update
www.tmworld.com | Sep 1, 2002
Product Update By Staff -- Test & Measurement World, 9/1/2002 2:00:00 AM Meter includes serial port The 4-1/2-digit Model 380193 LCR meter provides standard ranges for measurement of inductance (2000 µH to 10 kH), capacitance (2000 pF to 10 mF), and resistance (20 Ω to 10 MΩ). The meter also

CSP/BGA Test Sockets
semiconductor.net | Feb 1, 2002
These rf test sockets are designed for CSP/BGA devices with 0.5-1.27 mm pitch. The high-performance spring probe provides >500,000 insertion/withdrawal cycles with no loss of contact force or increase in contact resistance. Features include short signal path of 0.098 in. for 1.00 and 1.27 mm pitch

Products -- September 15, 2002: Test Head Manipulator
semiconductor.net | Sep 15, 2002
K300 test head manipulator is more maneuverable and lighter than comparable machines. It is available in maximum 150 and 300 lb test head weight capacities, and features full motion capability. Optional hardware includes a monitor/keyboard/ mouse/articulating arm mount, and equipment-containment

300 mm Parametric Test System
semiconductor.net | Oct 1, 2000
The 4073A parametric test system provides accurate evaluation of ultralow current and voltage on 300 mm wafers. Features include SECS/GEM interface link to all automation, ultra-low noise floor, measurement precision and resolution, and fast low-current

LDS Meter
semiconductor.net | Jul 13, 2000
Model 2500 Dual Photodiode Meter is a dual-channel instrument designed to test laser diode modules (LDMs). Channel 2 can be used as a separate, complete source/measure unit, or in conjunction with channel 1 to measure additional parameters such as coupl

Ethernet Test Cell
semiconductor.net | Oct 15, 2006
InSite MTH3 ensures 100% test cell integrity for volume production. It is an extension of InSite MES applications, providing additional control features. The test cell supports the communication between tester, handler and host to share the lot information, track the lots and provide counting

Test Series
semiconductor.net | Dec 1, 2003
The T2000 Series is for testing complex logic, mixed-signal and most SoC devices. The series is based on OPENSTAR, the universal test platform with interchangeable architecture recently introduced by the Semiconductor Test Consortium. The testers satisfy a myriad of test requirements, including 250

Event-Based IC Tester
semiconductor.net | Nov 1, 2002
CertiMAX design validation test system is for testing complicated ICs in the manufacturing test environment. The event-based technology is integrated into the Semiconductor Test Consortium’s open-architecture platform. The system simplifies the process of functional validation, debug...

Digital Imaging System
semiconductor.net | Oct 1, 2005
eVue is a digital imaging system that was designed to enable productivity gains in semiconductor wafer navigation and testing. It combines wafer probe navigation tools and advanced video processing with next-generation digital microscope technology, and is optimized for on-wafer test with the