WaveViewer software gets faster

News  |  www.tmworld.com | Mar 1, 2008

SynaptiCAD has released a new version of its free WaveViewer waveform-viewing tool. The new version can now read both analog and digital data captured by Agilent Technologies mixed-signal oscilloscopes. It also provides support for importing timing-parameter data in several field-programmable gate

http://www.tmworld.com/article/318624-WaveViewer_software_gets_faster.php?rssid=20431

NI debuts WiFi DAQ systems

News  |  www.tmworld.com | Sep 1, 2008

To complement the new wireless data-acquisition control capabilities of LabView 8.6, National Instruments has debuted 10 WiFi and Ethernet data-acquisition devices.

http://www.tmworld.com/article/317453-NI_debuts_WiFi_DAQ_systems.php?rssid=20431

CRM - Software Testing Techniques

Reliability and continuous availability have become crucial for computer software in the information economy. Well-publicized failures from both industry and government have underscored the need for mission-critical software to be thoroughly tested before being released into the marketplace.

http://www.charlesriver.com/books/BookDetail.aspx?productID=91542

Microstar Laboratories' DAPstudio 2.5

News  |  www.designnews.com | Jun 26, 2006

New data formatting in rotating colors The newest in the Data Acquisition Processor (DAP) Measurement Studio software, DAPstudio 2.5 offers live data in bar graphs, line graphs, and waterfall formats, with flat and 3D views in each. Optional rotating colors for the waveforms in a waterfall graph

http://www.designnews.com/article/5106-Microstar_Laboratories_DAPstudio_2_5.php

Analyze optical receivers

News  |  www.tmworld.com | Feb 1, 2008

Anritsu‘s MP1800A signal-quality analyzer combines hardware and software to perform stressed-eye tests on optical receivers. The measurement suite consists of an MP1800A analyzer configured with a built-in synthesizer, a pulse pattern generator, and an error detector combined with stressed-eye

http://www.tmworld.com/article/322026-Analyze_optical_receivers.php?rssid=20431

SPS electronic GmbH. Software.

Complete and easy setting of test parameters for single test methods - in case of high voltage test e.g. TEST TIME, RAMP TIME, TEST VOLTAGE, RELEASE CURRENT, etc.

http://www.spselectronic.de/spsenglish/products/safetytester/software/software.php

Characterization System

News  |  www.semiconductor.net | Jun 16, 2001

Model 4200-SCS semiconductor characterization system provides lab-grade dc device characterization with real-time plotting and analysis. The instrument structure allows simultaneous measurement of up to eight measurement channels and software that requi

http://www.semiconductor.net/article/199994-Characterization_System.php

NI LabVIEW 8.5 Gets Right to the Multi-Core

News  |  www.designnews.com | Sep 22, 2008

The latest version of National Instruments' flagship embedded system design platform delivers the power of multi-core architectures to engineers and scientists looking to test how their software runs on these new, more powerful chip platforms.

http://www.designnews.com/article/48246-NI_LabVIEW_8_5_Gets_Right_to_the_Multi_Core.php

SPS electronic GmbH. Test adapter.

screws for the enclosure are pneumatically contacted with spring contact pins in 4-wire technique - with this method a missing screw can be pin pointed

http://www.spselectronic.de/spsenglish/products/safetytester/testadapter/testadapter/testadapter2.php?navid=10

Macraigor Systems Introduces Java Board Test Environment with Complete Software Package for Testing Target Systems via JTAG

Press Release  |  www.edn.com | Mar 31, 2009

Macraigor has taken three components that are available at no cost and combined them into a powerful board test environment. To this end, they have developed a step-by-step tutorial and examples to get the board test environment running as quickly as possible.

http://www.edn.com/pressRelease/2140344512.html?industryid=48821