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AR RF/Microwave Instrumentation manufactures and distributes RF amplifiers, microwave amplifiers, antennas, transient generators, precompliance test systems, and other products for EMC and RF testing.
Calibrating RF test systems with an RF power meter
Learn how an RF power meter can be used to calibrate insertion loss through a simple RF power measurement.
TechOnline | Simplify RF Test Systems Using New Innovations in Network Analysis
This web cast uses a PNA-X network analyzer as an example to show how a single-connection, multi-measurement test system can be built. Calibration techniques will also be discussed.
IBM Software events - Rational Developer for System z Unit test – The Affordable Solution for
The two business challenges which face System z application development and maintenance are that of Availability of the environment and Cost of the environment.
TechOnline | Comparing LXI and PXI as Measurement Platforms
This webcast will examine the two latest test system architectures: LXI and PXI, comparing them as measurement platforms. Since each platform has strengths and weaknesses, we will show application areas where each architecture excels and where you should be most careful. We will make a few
TechOnline | Optimizing System Performance:Using the capabilities of new, smart instruments
The last of three webcasts will focus on the new capabilities that are provided by smart instruments in LXI. The smart, distributed nature of LXI instruments allows you to pre-load actions and coordinate between actions on various instruments to optimize performance and simplify test programming.
TechOnline | LTE MIMO System-Level Design and Test
In this webcast, system-level design simulations will be examined for LTE 2x2 MIMO transmitter and receiver design case studies. RF/baseband design trade-offs will be discussed. A transmitter case study will investigate simulated transmitter design impairments and their effects on system-level
How to Build Better Ethernet-Based Test Systems with LXI
Webcast: How to Build Better Ethernet-Based Test Systems with LXI Date: October 26, 2010 Time: 2:00 PM ET Duration: 1 Hour + Live Q&A Sponsored by: LXI Consortium and Test & Measurement World Presenters: Charles Cimino, Marketing Director Keithley Instruments, Inc., Klaus Diederich, CEO, Sales and
Non-Intrusive Board Test: New Technologies for Validation and Test within Design and Manufacturing
Webcast: Non-Intrusive Board Test: New Technologies for Validation and Test within Design and Manufacturing Date: September 28, 2010 Sponsored by: ASSET InterTech and Test & Measurement World Exclusive Webcast: Non-intrusive board test (NBT) is a software-driven methodology for functional
TechOnline | Getting the most out of LXI and PXI
In the first webcast, we covered the relative strengths of LXI and PXI as measurement platforms. This webcast will provide more detail on how to maximize the usefulness of each platform. It will explore the different design philosophies behind LXI and PXI and show how to use this effectively to
