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Whitepaper  |  www.arieselec.com | May 26, 2008

Semiconductor design engineers have been under constant competitive pressure to provide more features and functions, all with lighter weights, smaller sizes, and lower costs.

http://www.arieselec.com/white_papers/ic_test_sockets.htm

APC - Product Information

Security incidents are rising at an alarming rate every year. As the complexity of the threats increases, so do the security measures required to protect networks.

http://www.apcc.com/prod_docs/results.cfm?DocType=White%20Paper&Query_Type=3&Value=226

White paper_Cleaning Webcast.doc

Whitepaper  |  www.semiconductor.net

The SEZ Group is the leading provider of single -wafer, wet-processing solutions for the global semiconductor industry. With an installed base of more than 1,100 spin-processing tools, SEZ’s systems span across today’s leading IC manufacturers.

http://www.semiconductor.net/file/2922-Click_here.pdf

ICONICS, Inc.

Whitepaper  |  www.iconics.com | Dec 18, 2008

Recently, visualization systems have taken a giant step forward incorporating advanced hardware accelerated 3D graphics into standard off-the commercial product.

http://www.iconics.com/support/whitepapers.asp

RTP4MUX: A Novel MPEG-4 RTP Payload For Multicast Video Communications Over Wireless IP -

The ISO/IEC MPEG-4 multimedia content creation, management and distribution framework is foreseen to be an important component of many forthcoming Wireless IP Multimedia services.

http://www.broadcastpapers.com/whitepapers/RTP4MUX-A-Novel-MPEG-4-RTP-Payload-For-Multicast-Video-Communications-Over-Wireless-IP-.cfm?objid=32&pid=51&fromCategory=25

Keithley White Paper Describes Semiconductor Characterization and Parametric Test Challenges :

Whitepaper  |  www.electronicspecifier.com | Mar 24, 2009

White Paper Describes Semiconductor Characterization and Parametric Test Challenges : Electronics News from Electronic Specifier

http://www.electronicspecifier.com/Test-and-Measurement/Keithley-White-Paper-Describes-Semiconductor-Characterization-and-Parametric-Test-Challenges.asp

Frederic Tilhac, European Technical Program Manager for Test Advantage Software Products, presented...

Frederic Tilhac, European Technical Program Manager for Test Advantage Software Products, presented a comprehensive paper during the “Test Engineering” Vendor Session addressing all the key elements for implementing an effective DPPM improvement program.

http://www.testadvantage.com/whitepapers.aspx

Introducing Process Variability Score for Process Window OPC Optimization

Whitepaper  |  www.techonline.com | Nov 4, 2009

As the IC Industry moves towards 32nm technology node and below, it becomes important to study the impact of process window variations on yield. PVBands is a technique to express process parameter variations such as dose, focus, mask size, etc.

http://www.techonline.com/learning/techpaper/221600315

RFIC Design White Paper - 0.13um RF CMOS Solution

Applications such as WLAN, Bluetooth®, 3G, gigabit ethernet, and portable communications devices are fueling the demand for advanced Mixed Signal/RF CMOS semiconductors.

http://www.ansoft.com/rf_cmos.cfm

White Paper: Enabling Ethernet-Over-NG-SONET/SDH/PDH Solutions for MSPP Linecards

Whitepaper  |  www.altera.com | Apr 24, 2009

The combination of Altera’s Arria II GX family and TPACK’s 2.5-Gbps/10-Gbps Ethernet-over-SONET/SDH and 10-Gbps/20-Gbps switch/NPU solutions meets the requirements of next-generation MSPP linecards and maintains existing infrastructure.

http://www.altera.com/literature/wp/wp-01098-arria-ii-gx-ng-sonet-sdh-pdh-mspp.pdf