Whitepapers
TechOnline | Beyond Pass/Fail Testing: Using Failure Data from Manufacturing Test for Yield
Scan design has been the enabling technology for high quality manufacturing test for many years. Now with advanced diagnostics capabilities, a company's investment in scan design can now be used
CMDB: The Key to Infrastructure Visibility >> A Catalyst for Improving IT Service Management A...
CMDB: The Key to Infrastructure Visibility >> A Catalyst for Improving IT Service Management A SunView Software White Paper March 2007 CMDB: The Key to Infrastructure Visibility | March 2007 SunView Software, Inc ChangeGear TM >> Table of Contents Executive Summary . . . . . . . . . . . . . . .
IBM Power Systems: Designed for Availability
The IBM POWER6 Availability strategy is deeply rooted in an extensive history spanning multiple decades of mainframe development.
Six steps toward assuring service availability and performance.
March 2008 Service management solutions White paper Six steps toward assuring service availability and performance. Six steps toward assuring service availability and performance. 2 Overview In today’s business world, the proper management of business services has become a key factor in
Risk White Paper7Apr08
RC24534 (C0804-008) April 14, 2008 Mathematics IBM Research Report Harnessing Uncertainty: The Future of Risk Analytics Bonnie Ray, Chid Apte, Kevin McAuliffe, Lea Deleris IBM Research Division Thomas J. Watson Research Center P.O. Box 218 Yorktown Heights, NY 10598 Eric Cope IBM Research GmbH
Problem Management in the Networking Environment [High Availability] - Cisco Systems
<a href="http://www.cisco.com/en/US/technologies/tk869/tk769/technologies_white_paper0900aecd806c3eee.html">Problem Management in the Networking Environment</a>
TechOnline | The Failure Mode and Effect Analysis (FMEA) Implementation for CSD
This application note describes functions that allow you to perform run-time sensor diagnostics in CSD based designs.
TechOnline | Layout-Aware Diagnosis
Scan logic diagnosis is a powerful tool to help failure analysis engineers determine the root cause of a failing die. Yield engineers, on the other hand, are interested in statistical analysis of volumes of high-quality diagnosis results to determine yield limiters.
TechOnline | Faster Time to Root Cause with Diagnosis-Driven Yield Analysis
This white paper describes the benefits of implementing a diagnosis-driven yield analysis flow using the Tessent Diagnosis and Tessent YieldInsight software products.
IBM Techdocs White Paper: z/OS Predictive Failure Analysis
z/OS introduces Predictive Failure Analysis (PFA). With PFA, z/OS extends its high availability characteristics by going beyond failure detection to predicting problems before they occur. Your z/OS system will be designed to learn heuristically from its own environment to anticipate and report on
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